Structural, optical and electrical properties of ZnO/Zn 2 GeO 4 porous-like thin film and wires

Applied Surface Science

Volumn 257, Issue 11, 2011, Pages 4890-4895

  Jumidali, Mohd Muzafa ^a,b   Sulieman, Kamal Mahir ^a,c   Hashim, Md Roslan ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

^b UNIVERSITI TEKNOLOGI MARA   (Malaysia)

^c Alzaiem Alazhary University   (Sudan)

Author keywords

Electrical properties; MSM photodetector; Optical properties; Porous like structure; Structural properties

Indexed keywords

ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; GERMANIUM OXIDES; II-VI SEMICONDUCTORS; OPTICAL PROPERTIES; PHOTODETECTORS; PHOTOLUMINESCENCE; PHOTOLUMINESCENCE SPECTROSCOPY; PHOTONS; SCANNING ELECTRON MICROSCOPY; THERMAL EVAPORATION; THIN FILMS; WIDE BAND GAP SEMICONDUCTORS; WIRE; X RAY DIFFRACTION; ZINC OXIDE;

CURRENT-VOLTAGE MEASUREMENTS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; METAL SEMICONDUCTOR METAL PHOTODETECTOR; MSM PHOTODETECTOR; OPTICAL AND ELECTRICAL PROPERTIES; POROUS-LIKE STRUCTURES; ROOM TEMPERATURE PHOTOLUMINESCENCE SPECTRA; STRUCTURAL AND OPTICAL PROPERTIES;

STRUCTURAL PROPERTIES;

EID: 79951682791     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2010.12.139     Document Type: Article

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