Analyzing UV/Vis/NIR spectra - Addition of oxygen and nitrogen to ZnO:Al thin films

IEEE Sensors Journal

Volumn 11, Issue 4, 2011, Pages 905-912

  Stadler, Andreas ^a   Stöllinger, Johannes ^a   Dittrich, Herbert ^a  

^a UNIVERSITY OF SALZBURG   (Austria)

Author keywords

Aluminum doped zinc oxide (ZnO:Al); spectroscopy; transparent conductive oxide (TCO); ultraviolet visible near infrared (UV Vis NIR)

Indexed keywords

ABSORPTION COEFFICIENTS; ANALYSIS MODELS; BAND GAP ENERGY; COMPLEX PARAMETER; CONDUCTIVITY MEASUREMENTS; DOUBLE LAYER SYSTEMS; ELECTRICAL DATA; NITROGEN ADDITIONS; NON-CONTACT; OPTICAL ANALYSIS; REFLECTION SPECTRA; SOLAR CELL DESIGN; SOLAR-CELL APPLICATIONS; TRANSPARENT-CONDUCTIVE- OXIDE (TCO); ULTRAVIOLET/VISIBLE/NEAR-INFRARED (UV/VIS/NIR); XRD; ZNO; ZNO:AL THIN FILMS;

ALUMINUM; ARGON; CONDUCTIVE FILMS; INERT GASES; NITROGEN; OPTICAL CONDUCTIVITY; OPTICAL SENSORS; OXYGEN; REFRACTIVE INDEX; SOLAR CELLS; SOLAR ENERGY; SPECTRUM ANALYSIS; THIN FILMS; VAPOR DEPOSITION; ZINC; ZINC OXIDE;

OXIDE FILMS;

EID: 79951544804     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2010.2091499     Document Type: Article

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