Analyzing UV/Vis/NIR spectra - Correct and efficient parameter extraction

IEEE Sensors Journal

Volumn 10, Issue 12, 2010, Pages 1921-1931

  Stadler, Andreas ^a  

^a UNIVERSITY OF SALZBURG   (Austria)

Author keywords

Insulator; semiconductor; solar cell; spectroscopy; transparent conducting oxide (TCO); UV Vis NIR

Indexed keywords

ABSORBING LAYERS; APPROPRIATE MATERIALS; BUSINESS COMPANIES; COMPLEX PARAMETER; INSULATOR; INTEGRATING SPHERES; MEASURED DATA; MULTI-LAYER SYSTEM; N-DOPED; OPTICAL ANALYSIS; OPTICAL PARAMETER; PERKIN-ELMER LAMBDA; QUANTUM MECHANICAL POTENTIAL; REFLECTION SPECTRA; SEMICONDUCTOR; SILICATE GLASS; SINGLE LAYER; SPECTROSCOPY MEASUREMENTS; THIN-FILM SOLAR CELLS; TRANSPARENT CONDUCTING OXIDE; UV/VIS/NIR; ZNO;

BORON; FILM PREPARATION; PARAMETER EXTRACTION; QUANTUM THEORY; SEMICONDUCTING GLASS; SEMICONDUCTING SILICON; SILICATES; SOLAR CELLS; ZINC OXIDE;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 77958015199     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2010.2053704     Document Type: Article

References (28)

1. R. E. Denton et al., "The determination of the optical constants of thin films from measurements of reflectance and transmittance at normal incidence", J. Phys. D: Appl. Phys., vol. 5, p. 852, 1972.
2. J. Szczyrbowski, "Determination of optical constants of real thin films", J. Phys. D: Appl. Phys., vol. 11, p. 583, 1978.
3. K. L. Chopra and S. R. Das, Thin Film Solar Cells. New York: Plenum Press, 1983, 0-306-41141-5.
4. R. Swanepoel, "Determination of the thickness and optical constants of amorphous silicon", J. Phys. E: Sci. Instrum., vol. 16, p. 1214, 1983.
5. E. Márquez, "Calculation of the thickness and optical constants of amorphous arsenic sulphide films from their transmission spectra", J. Phys. D: Appl. Phys., vol. 25, pp. 535-541, 1992.
6. M. Kubinyi et al., "Determination of the thickness and optical constants of thin films from transmission spectra", Thin Solid Films, vol. 286, pp. 164-169, 1996.
7. A. Penzkofer et al., "Optical constants measurement of single-layer thin films on transparent substrates", Opt. Commun., vol. 158, pp. 221-230, 1998.
8. D. Reichl, "Aufbau, Charakterisierung und Optimierung eines optischen Sensorsystems zur reflektometrischen Interferenzspektroskopie mit mehrfarbigen Leuchtdioden", Ph. D. dissertation, Eberhard-Karls- Universität, Tübingen, Germany, 2000.
9. A. Schütz, "Einsatz der reflektometrischen Interferenzsektroskopie (RIfS) zur markierungsfreien Affinitätsdetektion für das Hochdurchsatzscreening", Ph. D. dissertation, Eberhard-Karls-Universität, Tübingen, Germany, 2000.
10. Y. Laaziz, "Optical characterization of low optical thickness thin films from transmittance and back reflectance measurements", Thin Solid Films, vol. 372, pp. 149-155, 2000.
11. H. P. Yozgatli, "Unsicherheitsbilanzen in der quantitativen FT-IR-Spektroskopie", Ph. D. dissertation, Humboldt-Universität zu Berlin, Berlin, Germany, 2002.
12. D. Poelman et al., "Methods for the determination of the optical constants of thin films from single transmission measurements: A critical view", J. Phys. D: Appl. Phys., vol. 36, pp. 1850-1857, 2003.
13. S. A. Scheer, The design of a cost effective multi wavelength development rate monitoring tool, 2005. [Online]. Available: Thicknessdetection.com
14. G. T. Belge, "Polymere in dünnen Schichten", Ph. D. dissertation, Eberhard-Karls-Universität, Tübingen, Germany, 2006.
15. P. Kluvánek et al., Elsevier, J. Non-Cryst. Sol., vol. 353, pp. 2004-2007, 2007.
16. M. Born, Optik. Berlin, Germany: Springer-Verlag, 1985, 3-540-05954-7, 3. Aufl.
17. E. Hecht, Optik. München, Germany: Oldenbourg Verlag, 2005, 3-486-27359-0, 4. Aufl.
18. A. Stadler, Analysen für Chalkogenid-Dünnschicht-Solarzellen. Wiesbaden, Germany: Vieweg+Teubner, 2010, 978-3-8348-0993-3, 1. Aufl.
19. H. J. Muffler, "Umsetzung und Funktionsprinzip eines alternativen Material-und Abscheidekonzepts für Pufferschichten von Solarzellen", Ph. D. dissertation, Freie Universität Berlin, Berlin, Germany, 2001.
20. J. Rostalski, "Der photovoltaisch aktive Bereich molekularer organischer Solarzellen", Ph. D. dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, Aachen, Germany, 1999.
21. H. H. Perkampus, UV-VIS Spectroscopy and Its Application. Berlin, Germany: Springer Verlag, 1992, 3-540-55421-1.
22. W. Gottwald and K. H. Heinrich, UV/VIS-Spektroskopie für Anwender. New York: Wiley, 1998, 3-527-28760-4.
23. J. Keradec, M. S. thesis, L'Université Scientifique et Médicale de Grenoble. Grenoble, France, 1973.
24. 2+x thin films", Elsevier Physica B, vol. 370, pp. 264-276, 2005.
25. S. M. Sze, Physics of Semiconductor Devices. New York: Wiley, 1981, 0-471-05661-8.
26. H. J. Möller, Semiconductors for Solar Cells. Norwood, MA: Artech House, 1993, 0-89006-574-8.
27. X. W. Sun et al., "Optical properties of epitaxially grown zinc oxide films on sapphire by pulsed laser deposition", J. Appl. Phys., vol. 86, no. 1, Jul. 1, 1999.
28. Sokolov, "Electrical conductivity of zinc oxide in atomic nitrogen", Russian Phys. J., pp. 1158-1159, 10.1007BF00890479.