Hole injection/transport materials derived from heck and sol-gel chemistry for application in solution-processed organic electronic devices

Journal of the American Chemical Society

Volumn 133, Issue 5, 2011, Pages 1375-1382

  Lim, Younhee ^a   Park, Young Seo ^a   Kang, Yerang ^a   Jang, Do Young ^a   Kim, Joo Hyun ^b   Kim, Jang Joo ^a   Sellinger, Alan ^c   Yoon, Do Y ^a  

^a Seoul National University   (South Korea)

^b Pukyong National University   (South Korea)

^c Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC AMINES; CONTROL DEVICE; CROSS-LINKED POLYMERS; DEFECT-FREE; ELECTROCHEMICAL STABILITIES; EMITTING LAYER; ETHYLENEDIOXYTHIOPHENES; EXTENDED CONJUGATION; HIGH CURRENT DENSITIES; ITO ELECTRODES; ORGANIC ELECTRONIC DEVICES; ORGANOSILICATES; PEDOT:PSS; PLANARIZING; POLY(STYRENE SULFONATE); SI ATOMS; SOL-GEL CHEMISTRY; SOLUTION-PROCESSED; SOLVENT RESISTANCE; THERMAL CROSSLINKING; TRIETHOXYSILYL; TURN ON VOLTAGE;

CROSSLINKING; FILM PREPARATION; GELS; IRIDIUM; LIGHT EMITTING DIODES; ORGANIC LIGHT EMITTING DIODES (OLED); POLYMER FILMS; SOL-GEL PROCESS; SOL-GELS; SOLS; THERMOELECTRIC EQUIPMENT;

ELECTRON DEVICES;

IRIDIUM; MONOMER; POLYMER;

ARTICLE; CONJUGATION; CONTROLLED STUDY; CROSS LINKING; DENSITY; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; ELECTRODE; GEL; HECK REACTION; LIGHT EMITTING DIODE; LUMINANCE; SYNTHESIS;

EID: 79551716690     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja1061517     Document Type: Article

References (39)

1. de Jong, M. P.; van Ijzendoorn, L. J.; de Voigt, M. J. A. Appl. Phys. Lett. 2000, 77, 2255
2. Wong, K. W.; Yip, H. L.; Luo, Y.; Wong, K. Y.; Lau, W. M.; Low, K. H.; Chow, H. F.; Gao, Z. Q.; Yeung, W. L.; Chang, C. C. Appl. Phys. Lett. 2002, 80, 2788
3. Nguyen, T. P.; de Vos, S. A. Appl. Surf. Sci. 2004, 221, 330
4. Lee, J. Y. Synth. Met. 2006, 156, 537
5. Kim, J.-S.; Ho, P. K. H.; Murphy, C. E.; Seeley, A. J. A. B.; Grizzi, I.; Burroughes, J. H.; Friend, R. H. Chem. Phys. Lett. 2004, 386, 2
6. Kim, J.-S.; Friend, R. H.; Grizzi, I.; Burroughes, J. H. Appl. Phys. Lett. 2005, 87, 023506
7. Bacher, E.; Bayerl, M.; Rudati, P.; Reckefuss, N.; Müller, C. D.; Meerholz, K.; Nuyken, O. Macromolecules 2005, 38, 1640
8. Bellmann, E.; Shaheen, S. E.; Thayumanavan, S.; Barlow, S.; Grubbs, R. H.; Marder, S. R.; Kippelen, B.; Peyghambarian, N. Chem. Mater. 1998, 10, 1668
9. Bacher, A.; Erdelen, C. H.; Paulus, W.; Ringsdorf, H.; Schmidt, H.-W.; Schuhmacher, P. Macromolecules 1999, 32, 4551
10. Jungermann, S.; Riegel, N.; Müller, D.; Meerholz, K.; Nuyken, O. Macromolecules 2006, 39, 8911
11. Domercq, B.; Hreha, R. D.; Zhang, Y.-D.; Larribeau, N.; Haddock, J. N.; Schultz, C.; Marder, S. R.; Kippelen, B. Chem. Mater. 2003, 15, 1491
12. Liu, S.; Jiang, X.; Ma, H.; Liu, M. S.; Jen, A. K.-Y. Macromolecules 2000, 33, 3514
13. Lim, B.; Hwang, J.-T.; Kim, J. Y.; Ghim, J.; Vak, D.; Noh, Y.-Y.; Lee, S.-H.; Lee, K.; Heeger, A. J.; Kim, D.-Y. Org. Lett. 2006, 8, 4703
14. Niu, Y.-H.; Liu, M. S.; Ka, J.-W.; Jen, A. K.-Y. Appl. Phys. Lett. 2006, 88, 093505
15. Liu, M. S.; Niu, Y.-H.; Ka, J.-W.; Yip, H.-L.; Huang, F.; Luo, J.; Kim, T.-D.; Jen, A. K.-Y. Macromolecules 2008, 41, 9570
16. Ma, B.; Lauterwasser, F.; Deng, L.; Zonte, C. S.; Kim, B. J.; Fréchet, J. M. J.; Borek, C.; Thompson, M. E. Chem. Mater. 2007, 19, 4827
17. Paul, G. K.; Mwaura, J.; Argun, A. A.; Taranekar, P.; Reynolds, J. R. Macromolecules 2006, 39, 7789
18. Niu, Y.-H.; Liu, M. S.; Ka, J.-W.; Bardeker, J.; Zin, M. T.; Schofield, R.; Chi, Y.; Jen, A. K.-Y. Adv. Mater. 2007, 19, 300
19. Cheng, Y.-J.; Liu, M. S.; Zhang, Y.; Niu, Y.; Huang, F.; Ka, J.-W.; Yip, H.-L.; Tian, Y.; Jen, A. K.-Y. Chem. Mater. 2008, 20, 413
20. Yan, H.; Lee, P.; Armstrong, N. R.; Graham, A.; Evmenenko, G. A.; Dutta, P.; Marks, T. J. J. Am. Chem. Soc. 2005, 127, 3172
21. Yan, H.; Huang, Q.; Scott, B. J.; Marks, T. J. Appl. Phys. Lett. 2004, 84, 3873
22. Li, J.; Marks, T. J. Chem. Mater. 2008, 20, 4873
23. Huang, Q.; Li, J.; Marks, T. J.; Evmenenko, G. A.; Dutta, P. J. Appl. Phys. 2007, 101, 093101
24. Huang, Q.; Li, J.; Evmenenko, G. A.; Dutta, P.; Marks, T. J. Chem. Mater. 2006, 18, 2431
25. Huang, Q.; Evmenenko, G. A.; Dutta, P.; Lee, P.; Armstrong, N. R.; Marks, T. J. J. Am. Chem. Soc. 2005, 127, 10227
26. Huang, Q.; Evmenenko, G.; Dutta, P.; Marks, T. J. J. Am. Chem. Soc. 2003, 125, 14704
27. Cui, J.; Huang, Q.; Veinot, J. C. G.; Yan, H.; Wang, Q.; Hutchison, G. R.; Richter, A. G.; Evmenenko, G.; Dutta, P.; Marks, T. J. Langmuir 2002, 18, 9958
28. Wahab, M. A.; Sudhakar, S.; Yeo, E.; Sellinger, A. Chem. Mater. 2008, 20, 1855
29. Littke, A. F.; Fu, G. C. J. Am. Chem. Soc. 2001, 123, 6989
30. Shea, K. J.; Loy, D. A. Chem. Mater. 2001, 13, 3306
31. Lee, J,-K.; Char, K.; Rhee, H.-W.; Ro, H. W.; Yoo, D. Y.; Yoon, D. Y. Polymer 2001, 42, 9085
32. Dong, H.; Brook, M. A.; Brennan, J. D. Chem. Mater. 2005, 17, 2807
33. Bernards, D. A.; Malliaras, G. G. Adv. Funct. Mater. 2007, 17, 3538
34. Pasveer, W. F.; Cottaar, J.; Tanase, C.; Coehoorn, R.; Bobbert, P. A.; Blom, P. W. M.; de Leeuw, D. M.; Michels, M. A. J. Phys. Rev. Lett. 2005, 94, 206601 The mobilities in refs 17, 33, and 35 were obtained from space charge limited current (SCLC) hole-only devices, which yield mobility values somewhat different from the values obtained from thin film transistor (TFT) characteristics as employed in this study. The relationship between the SCLC mobility and the TFT mobility can be found from a reference
35. Craciun, N. I.; Wildeman, J.; Blom, P. W. M. J. Phys. Chem. C 2010, 114, 10559
36. Xia, H.; Li, M.; Lu, D.; Zhang, C.; Xie, W.; Liu, W.; Yang, B.; Ma, Y. Adv. Funct. Mater. 2007, 17, 1757
37. Shi, M.-M.; Lin, J.-J.; Shi, Y.-W.; Ouyang, M.; Wang, M.; Chen, H.-Z. Mater. Chem. Phys. 2009, 115, 841
38. Kang, J.-W.; Lee, D.-S.; Park, H.-D.; Park, Y.-S.; Kim, J. W.; Jeong, W.-I.; Yoo, K.-M.; Go, K.; Kim, S.-H.; Kim, J.-J. J. Mater. Chem. 2007, 17, 3714
39. Yamanari., T.; Taima, T.; Sakai, J.; Tsukamoto, J.; Yoshida, Y. Jpn. J. Appl. Phys. 2010, 49, 01AC02