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Volumn 98, Issue 4, 2011, Pages

Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry

(8) Hofmann, T a Boosalis, A a Kuhne P a Herzinger, C M b Woollam, J A b Gaskill, D K c Tedesco, J L c Schubert, M a

a UNIVERSITY OF NEBRASKA LINCOLN (United States)

b J A WOOLLAM CO INC (United States)

c NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

6H-SILICON CARBIDES; CHANNEL CONDUCTIVITY; DATA ANALYSIS; EFFECTIVE MASS; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; HALL EFFECT MEASUREMENT; MIDINFRARED; NON-CONTACT; OPTICAL DETERMINATION; P-TYPE; POLAR SURFACES; ROOM TEMPERATURE; SEMI-INSULATING; SHEET DENSITY; TERA HERTZ;

ELLIPSOMETRY; EPITAXIAL GROWTH; GRAPHENE; GYRATORS; HALL MOBILITY; SILICON CARBIDE;

GALVANOMAGNETIC EFFECTS;

EID: 79551629860 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3548543 Document Type: Article

Times cited : (40)

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