An additional axis for the surface X-ray diffractometer

Journal of Synchrotron Radiation

Volumn 5, Issue 3, 1998, Pages 893-895

  Takahasi, Masamitu ^a   Mizuki, Jun'ichiro ^a  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

Correction factors; Diffractometers; Surface X ray diffraction

Indexed keywords

EID: 0032364286     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049597016014     Document Type: Article

References (10)

1. Evans-Lutterodt, K. W. & Tang, M. T. (1995). J. Appl. Cryst. 28, 318-326.
2. Feidenhans'l, R. (1989). Surf. Sci. Rep. 10, 105-188.
3. Ferrer, S. & Comin, F. (1995). Rev. Sci. Instrum. 66, 1674-1676.
4. Lohmeier, M. & Vlieg, E. (1993). J. Appl. Cryst. 26, 706-716.
5. Schamper, C., Meyerheim, H. L. & Moritz, W. (1993). J. Appl. Cryst. 26, 687-696.
6. Specht, E. D. & Walker, F. J. (1993). J. Appl. Cryst. 26, 166-171.
7. Takahashi, T. & Nakatani, S. (1995). Surf. Sci. 326, 347-360.
8. Takahasi, M. (1996). Thesis, University of Tokyo, Japan. (In Japanese.)
9. Takahasi, M., Nakatani, S., Ito, Y., Takahashi, T., Zhang, X. W. & Ando, M. (1996). Surf. Sci. 357/358, 78-81.
10. Vlieg, E. (1997). J. Appl. Cryst. 30, 532-543.