High-resolution three-dimensional reciprocal space mapping of semiconductor nanostructures

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 8, 2009, Pages 1771-1774

  Mariager, Simon O ^a   Schlepütz, Christian M ^b   Aagesen, Martin ^a   Sørensen, Claus B ^a   Johnson, Erik ^a   Willmott, Philip R ^b   Feidenhans'l, Robert ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG POINT; CRYSTAL TRUNCATION ROD; DIFFUSE SCATTERING; GAAS; HIGH RESOLUTION; ISO SURFACE; MICROFACETS; PILATUS; RECIPROCAL SPACE MAPPING; RECIPROCAL SPACE MAPS; SEMICONDUCTOR NANOSTRUCTURES; ZINCBLENDE STRUCTURES;

CRYSTAL GROWTH; ELECTRIC WIRE; GALLIUM ALLOYS; MOLECULAR BEAMS; MOLECULAR DYNAMICS; NANOWIRES; SEMICONDUCTING GALLIUM; TWO DIMENSIONAL;

THREE DIMENSIONAL;

EID: 68649125291     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881612     Document Type: Conference Paper

References (13)

1. S. Keller, C. Schaake, N. A. Fichtenbaum, C. J. Neufeld, Y. Wu, K. McGoddy, A. David, S. P. DenBaars, C. Weisbuch, J. S. Speck, and U. K. Mishra, J. Appl. Phys. 100, 054314 (2006).
2. J. Eymery, F. Rieutord,V. Favre-Nicolin, O. Robach,Y. Niquet, L. Fröberg, T. M°artensson, and L. Samuelson, Nano Lett. 7, 2596 (2007).
3. O. Sakata, M. Takata, H. Suematsu, A. Matsuda, S. Akiba, A. Sasaki, and M.Youshimoto, Appl. Phys. Lett. 84, 4239 (2004).
4. E. F. Eikenberry, Ch. Brönnimann, G.Ḧulsen, H. Toyokawa, R. Horisberger, B. Schmitt, C. Schulze-Briese, and T. Tomizaki, Nucl. Instrum. Methods Phys. Res. A 501, 260 (2003).
5. P. Yang, Y. Wu, and R. Fan, Int. J. Nanosci. 1, 1 (2002).
6. A. Mikkelsen, N. Sköld, L. Ouattara, M. Borgstöm, J. N. Andersen, L. Samuelson,W. Seifert, and E. Lundgren, Nature Mater. 3, 519 (2004).
7. Z. Zhu, T. Andelman, M. Yin, T.-L. Chen, S. P. O'Brien, and R. M. Osgood, J. Mater. Res. 20, 1033 (2005).
8. V. Charmard, J. Stangl, S. Labat, B. Mandl, R. T. Lechner, and T. H. Metzger, J. Appl. Crystallogr. 41, 272 (2008).
9. O. Bunk and M. M. Nielsen, J. Appl. Cryst. 37, 216 (2004).
10. O. Robach, Y. Garreau, K. Aid, and M. B. V́eron-Jolliet, J. Appl. Crystallogr. 33, 1006 (2000).
11. R. Feidenhans'l, Surf. Sci. Rep. 10, 105 (1989).
12. L. S. Karlsson, K. A. Dick, J. B. Wagner, J. Malm, K. Deppert, L. Samuelson, and L. R.Wallenberg, Nanotechnology 18, 485717 (2007).
13. K. A. Dick, K. Deppert, T. M°artensson, B. Mandl, L. Samuelson, and W. Seifert, Nano Lett. 5, 761 (2005).