Highly c-axis oriented ZnO film on silica glass using zinc naphthenate precursor

Journal of Materials Science

Volumn 40, Issue 1, 2005, Pages 237-239

  Kim, B H ^a   An, J H ^a   Jeon, Y S ^b   Jeong, J T ^b   Kang, B A ^b   Hwang, K S ^b  

^a Chonnam National University   (South Korea)

^b Nambu University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTROLUMINESCENCE; FUSED SILICA; HEAT TREATMENT; MATHEMATICAL MODELS; MORPHOLOGY; NAPHTHALENE; PARAMETER ESTIMATION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

MECHANICAL STABILITY; OXIDE MATERIALS; PIEZOELECTRIC CONSTANTS; POLYCRYSTALLINE STRUCTURES;

ZINC OXIDE;

EID: 14844342862     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10853-005-5717-y     Document Type: Article

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