Fundamental studies of molecular depth profiling using organic delta layers as model systems

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 81-83

  Lu, C ^a   Wucher, A ^b   Winograd, N ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

C60; delta layer; Langmuir Blodgett film; molecular depth profiling; SIMS

Indexed keywords

BARIUM ARACHIDATE; BUCKMINSTERFULLERENES; C60; CLUSTER ION BEAMS; DECAY LENGTH; DELTA LAYERS; DEPTH RESOLUTION; DIMYRISTOYL; GAUSSIAN PEAKS; HALF-WIDTH; LANGMUIR-BLODGETT MULTILAYERS; LAYER MODEL; MODEL SYSTEM; MOLECULAR DEPTH PROFILING; MULTILAYER STACKS; RESPONSE FUNCTIONS; SIMS; THREE DIMENSIONAL IMAGING; TRAILING EDGES;

ATOMIC FORCE MICROSCOPY; BARIUM; BIOLOGICAL MEMBRANES; CYTOLOGY; EXPONENTIAL FUNCTIONS; LANGMUIR BLODGETT FILMS; MULTILAYERS;

DEPTH PROFILING;

EID: 78951486826     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3409     Document Type: Conference Paper

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