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Volumn 108, Issue 11, 2010, Pages

Electrical characterization of HgTe nanowires using conductive atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ALTERNATIVE METHODS; ATOMIC FORCE MICROSCOPES; BAKING TEMPERATURE; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT VOLTAGE CURVE; ELECTRICAL CHARACTERIZATION; ELECTRON TRANSPORT; HIGH TEMPERATURE; LOW TEMPERATURES; MOVABLE ELECTRODES; ORDERS OF MAGNITUDE; POLYCRYSTALLINE NANOWIRES; ROUGH SURFACES; SCANNING ELECTRON MICROSCOPE; SELF-ORGANIZED;

EID: 78751561558     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3512960     Document Type: Article
Times cited : (4)

References (20)
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  • 16
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    • See supplementary material at E-JAPIAU-108-075022 for a representative I-V curve measured on the Au electrode and all I-V curves measured on nanowires A and B
    • See supplementary material at http://dx.doi.org/10.1063/1.3512960 E-JAPIAU-108-075022 for a representative I-V curve measured on the Au electrode and all I-V curves measured on nanowires A and B.
  • 17
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  • 20
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.