Size and grain-boundary effects of a gold nanowire measured by conducting atomic force microscopy

Applied Physics Letters

Volumn 80, Issue 18, 2002, Pages 3346-3348

  Bietsch, Alexander ^a   Michel, Bruno ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; CONDUCTING ATOMIC FORCE MICROSCOPY; CROSS SECTION; GOLD NANOWIRE; GRAIN BOUNDARY EFFECTS; HIGHLY SENSITIVE; MOBILE ELECTRODES; NANO-METER-SCALE; POLYCRYSTALLINE GOLD; POLYCRYSTALLINE STRUCTURE; REFLECTION COEFFICIENTS; SINGLE GRAIN BOUNDARIES; SPECIFIC RESISTIVITIES; THIN METAL FILMS;

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; GOLD; GRAIN BOUNDARIES; NANOWIRES; PLATINUM; POLYCRYSTALLINE MATERIALS; SURFACE STRUCTURE;

WIRE;

EID: 79956041451     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1473868     Document Type: Article

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