Characterization of the ZnO thin films obtained by chemical route

Optoelectronics and Advanced Materials, Rapid Communications

Volumn 3, Issue 9, 2009, Pages 884-890

  Mihaiu, S ^a   Gartner, M ^a   Voicescu, M ^a   Gabor, M ^b   Mocioiu, O ^a   Zaharescu, M ^a  

^a ACADEMY OF ROMANIAN SCIENTISTS   (Romania)

^b TECHNICAL UNIVERSITY OF CLUJ NAPOCA   (Romania)

Author keywords

Chemical route; Electrical behaviour; Optical properties; ZnO films

Indexed keywords

BINDING ENERGY; ENERGY GAP; FIELD EFFECT TRANSISTORS; II-VI SEMICONDUCTORS; LIGHT EMISSION; METALLIC FILMS; OPTICAL PROPERTIES; OXIDE MINERALS; REFRACTIVE INDEX; SCHOTTKY BARRIER DIODES; SUBSTRATES; WIDE BAND GAP SEMICONDUCTORS; ZINC OXIDE;

CHEMICAL ROUTES; ELECTRICAL BEHAVIOUR; ELECTRICAL RESISTANCE MEASUREMENT; EXTINCTION COEFFICIENTS; LIGHT EMITTING DEVICES; NANODEVICE APPLICATIONS; PIEZOELECTRIC PROPERTY; ZNO FILMS;

THIN FILMS;

EID: 78751525168     PISSN: 18426573     EISSN: 20653824     Source Type: Journal    
DOI: None     Document Type: Article

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