The Meyer-Neldel rule in sol-gel derived polycrystalline ZnO:Al thin films

Solid State Communications

Volumn 147, Issue 11-12, 2008, Pages 465-469

  Sagar, Parmod ^a   Kumar, Manoj ^b   Mehra, R M ^c  

^a UNIVERSITY OF DELHI   (India)

^b Yonsei University   (South Korea)

^c UNIVERSITY OF DELHI   (India)

Author keywords

A. ZnO thin film; B. Sol gel process; D. Al doping; D. Electronic transport

Indexed keywords

ALUMINUM; CHEMICAL ACTIVATION; COLLOIDS; CONCENTRATION (PROCESS); ELECTRIC CONDUCTIVITY; GELATION; GELS; HEAT CONDUCTION; SEMICONDUCTING ZINC COMPOUNDS; SOL-GEL PROCESS; SOL-GELS; SOLS; THICK FILMS; THIN FILMS; ZINC ALLOYS; ZINC OXIDE;

AL DOPING; CONDUCTION MECHANISMS; CORNING (CO); ELECTRICAL CONDUCTION; ELECTRICAL CONDUCTIVITY; GLASS SUBSTRATES; HIGH TEMPERATURE RANGE; LOW TEMPERATURE (LTR); MEYER-NELDEL RULE (MNR); POLYCRYSTALLINE THIN FILMS; POLYCRYSTALLINE ZNO; SOL - GEL; VARIABLE RANGE HOPPING (VRH); WIDE-RANGE;

ACTIVATION ENERGY;

EID: 50949129798     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2008.07.001     Document Type: Article

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