A posteriori error estimate and convergence analysis for conductivity image reconstruction in MREIT

SIAM Journal on Applied Mathematics

Volumn 70, Issue 8, 2010, Pages 2883-2903

  Liu, Jijun ^a   Seo, Jinkeun ^b   Woo, Eungje ^c  

^a SOUTHEAST UNIVERSITY   (China)

^b Yonsei University   (South Korea)

^c Kyung Hee University   (South Korea)

Author keywords

Conductivity; Convergence; Error estimate; Helmholtz decomposition; Image reconstruction; MREIT; Relative contrast

Indexed keywords

CONDUCTIVITY; CONVERGENCE; ERROR ESTIMATE; HELMHOLTZ DECOMPOSITION; MREIT; RELATIVE CONTRAST;

ALGORITHMS; CONVERGENCE OF NUMERICAL METHODS; DIAGNOSTIC RADIOGRAPHY; ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ERROR ANALYSIS; ESTIMATION; EXPERIMENTS; HARMONIC ANALYSIS; IMAGE RECONSTRUCTION; INVERSE PROBLEMS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; RESONANCE;

MAGNETIC RESONANCE IMAGING;

EID: 78751501911     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/090781292     Document Type: Article

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