Electrical impedance tomography by elastic deformation

SIAM Journal on Applied Mathematics

Volumn 68, Issue 6, 2008, Pages 1557-1573

  Ammari, H ^a   Bonnetier, E ^b   Capdeboscq, Y ^c   Tanter, M ^a   Fink, M ^a  

^a INSTITUT LANGEVIN   (France)

^b UNIV GRENOBLE ALPES   (France)

^c UNIVERSITÉ DE VERSAILLES SAINT QUENTIN EN YVELINES   (France)

Author keywords

0 Laplacian; Asymptotic formula; Elastic perturbation; Electrical impedance tomography; Reconstruction; Substitution algorithm

Indexed keywords

ELECTRIC IMPEDANCE; ELECTRIC IMPEDANCE MEASUREMENT; IMAGE RECONSTRUCTION; PERTURBATION TECHNIQUES;

0-LAPLACIAN; ASYMPTOTIC FORMULA; CONDUCTIVITY DISTRIBUTIONS; CONDUCTIVITY IMAGING; COUPLING IMPEDANCES; ELASTIC PERTURBATIONS; ELECTRICAL IMPEDANCE TOMOGRAPHY; ELECTRICAL MEASUREMENT;

ELECTRIC IMPEDANCE TOMOGRAPHY;

EID: 69049090531     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/070686408     Document Type: Article

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