-
1
-
-
78651555204
-
-
Qualcomm Press Release, Close alliance with foundry partners drives qualcomm's integrated fabless manufacturing strategy, [Online]. San Diego, Oct. 2006. Available: http://www.qualcomm.co.in/press/ releases/2006/061026-manufacturing-common-platform.html
-
Qualcomm Press Release, "Close alliance with foundry partners drives qualcomm's integrated fabless manufacturing strategy," [Online]. San Diego, Oct. 2006. Available: http://www.qualcomm.co.in/press/ releases/2006/061026-manufacturing-common-platform.html
-
-
-
-
2
-
-
78651553362
-
-
June
-
Intel Technol. J., vol. 12, no. 2, June 2008.
-
(2008)
Intel Technol. J
, vol.12
, Issue.2
-
-
-
3
-
-
39049123009
-
Where CMOS is going: Trendy hype vs. real technology
-
Feb
-
T.-C. Chen, "Where CMOS is going: Trendy hype vs. real technology," in Proc. ISSCC'06, Feb. 2006.
-
(2006)
Proc. ISSCC'06
-
-
Chen, T.-C.1
-
7
-
-
44949250926
-
-
S. Takagia, et al., Carrier-transportenhanced CMOS using new channel materials and structures, presented at ISDRS, College Park, MD, Dec. 12-14, 2007.
-
S. Takagia, et al., "Carrier-transportenhanced CMOS using new channel materials and structures," presented at ISDRS, College Park, MD, Dec. 12-14, 2007.
-
-
-
-
8
-
-
37249080259
-
CMP fill synthesis: A survey of recent studies
-
Andrew, B. Kahng, and K. Samadi, "CMP fill synthesis: A survey of recent studies," IEEE Trans. Computer-Aided Design, vol. 27, no. 1, 2008.
-
(2008)
IEEE Trans. Computer-Aided Design
, vol.27
, Issue.1
-
-
Andrew, B.K.1
Samadi, K.2
-
9
-
-
34248209713
-
Pattern based prediction for plasma etch
-
K. O. Abrokwah, P. R. Chidambaram, and D. S. Boning, "Pattern based prediction for plasma etch," IEEE Trans. Semicond. Manufact., vol. 20, no. 2, 2007.
-
(2007)
IEEE Trans. Semicond. Manufact
, vol.20
, Issue.2
-
-
Abrokwah, K.O.1
Chidambaram, P.R.2
Boning, D.S.3
-
12
-
-
78651532982
-
Design challenges for gigascale integration
-
presented at the, Portland, OR
-
S. Borkar, "Design challenges for gigascale integration," presented at the 37th Annu. IEEE/ACM Int. Symp. Microarchitecture, Portland, OR, 2004.
-
(2004)
37th Annu. IEEE/ACM Int. Symp. Microarchitecture
-
-
Borkar, S.1
-
13
-
-
0032320827
-
Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 μm MOSFET's: A 3-D "Atomistic" simulation study
-
A. Asenov, "Random dopant induced threshold voltage lowering and fluctuations in sub-0.1 μm MOSFET's: A 3-D "Atomistic" simulation study," IEEE Trans. Electron. Devices, vol. 45, no. 12, pp. 2505-2513, 1998.
-
(1998)
IEEE Trans. Electron. Devices
, vol.45
, Issue.12
, pp. 2505-2513
-
-
Asenov, A.1
-
15
-
-
41549129053
-
Statistical timing analyses: From basic prnciples to state of the art
-
D. Blaauw, et al., "Statistical timing analyses: From basic prnciples to state of the art," IEEE Trans. Computer-Aided Design, vol. 27, no. 4, 2008.
-
(2008)
IEEE Trans. Computer-Aided Design
, vol.27
, Issue.4
-
-
Blaauw, D.1
|