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Volumn 509, Issue 5, 2011, Pages 2176-2179

Effect of Ag film thickness on the optical and the electrical properties in CuAlO2/Ag/CuAlO2 multilayer films grown on glass substrates

Author keywords

AFM; Atomic force microscopy; Electronic properties; Optical properties; Oxide materials; Thin films; X ray diffraction

Indexed keywords

AFM; AG FILMS; ATOMIC FORCE; ELECTRICAL PROPERTY; GLASS SUBSTRATES; HIGH-EFFICIENCY SOLAR CELLS; ISLAND STRUCTURE; OXIDE MATERIALS; POTENTIAL APPLICATIONS; TRANSPARENT CONDUCTING ELECTRODES;

EID: 78651353930     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.10.180     Document Type: Article
Times cited : (24)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.