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Volumn 98, Issue 1, 2011, Pages

Photoinduced evolution of surface-potential undulation observed on vacuum-deposited thin films of tris(8-hydroxyquinolinato) aluminum

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED TRAPS; KELVIN PROBE FORCE MICROSCOPY; LATERAL SIZES; NON-UNIFORM DISTRIBUTION; PHOTO-INDUCED; PHOTOENHANCEMENT; THICKNESS DEPENDENCE;

EID: 78651289410     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3533816     Document Type: Article
Times cited : (10)

References (24)
  • 2
    • 84891001810 scopus 로고    scopus 로고
    • (Wiley-VCH GmbH & Co. KGaA, Weinheim, Germany). 10.1002/3527606637
    • W. Brutting, Physics of Organic Semiconductors (Wiley-VCH GmbH & Co. KGaA, Weinheim, Germany, 2005). 10.1002/3527606637
    • (2005) Physics of Organic Semiconductors
    • Brutting, W.1
  • 3
    • 49949115288 scopus 로고    scopus 로고
    • 0304-3991,. 10.1016/j.ultramic.2008.04.083
    • Y. D. Kim, J. W. Park, I. N. Kang, and S. Y. Oh, Ultramicroscopy 0304-3991 108, 1237 (2008). 10.1016/j.ultramic.2008.04.083
    • (2008) Ultramicroscopy , vol.108 , pp. 1237
    • Kim, Y.D.1    Park, J.W.2    Kang, I.N.3    Oh, S.Y.4
  • 23
    • 0033718712 scopus 로고    scopus 로고
    • 0379-6779,. 10.1016/S0379-6779(99)00445-2
    • S. Karg, J. Steiger, and H. von Seggern, Synth. Met. 0379-6779 111-112, 277 (2000). 10.1016/S0379-6779(99)00445-2
    • (2000) Synth. Met. , vol.111 , pp. 277
    • Karg, S.1    Steiger, J.2    Von Seggern, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.