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Volumn 5, Issue , 2010, Pages 1148-1151

An ALD etch-back method to fabricate high aspect ratio nanopillar arrays for photonic crystal sensors

Author keywords

ALD; Hard materials; High aspect ratio; Photonic crystal sensors

Indexed keywords

ATOMIC LAYER DEPOSITION; DEPOSITION; HARDNESS; NANOSTRUCTURES; PHOTONIC CRYSTALS; PLASMA ETCHING; TITANIUM DIOXIDE;

EID: 78650602810     PISSN: None     EISSN: 18777058     Source Type: Conference Proceeding    
DOI: 10.1016/j.proeng.2010.09.314     Document Type: Conference Paper
Times cited : (3)

References (10)
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    • Macleod, H.A.1
  • 3
    • 0034140180 scopus 로고    scopus 로고
    • Spectroscopic ellipsometry of TiO2 layers prepared by ion-assisted electron-beam evaporation
    • Bhattacharyya D, Sahoo NK, Thakur S and Das NC. Spectroscopic ellipsometry of TiO2 layers prepared by ion-assisted electron-beam evaporation. Thin Solid Films 2000; 200, p. 96-102.
    • (2000) Thin Solid Films , vol.200 , pp. 96-102
    • Bhattacharyya, D.1    Sahoo, N.K.2    Thakur, S.3    Das, N.C.4
  • 4
    • 0036642272 scopus 로고    scopus 로고
    • Optical constants of heat-treated TiO2 thin films
    • Mardare D. Optical constants of heat-treated TiO2 thin films. Mat Sci Eng 2002; B95, p. 83-87.
    • (2002) Mat Sci Eng , vol.B95 , pp. 83-87
    • Mardare, D.1
  • 7
    • 21744444606 scopus 로고    scopus 로고
    • Surface chemistry of atomic layer depostion: A case study for the trimethylaluminum/water process
    • Puurunen RL. Surface chemistry of atomic layer depostion: A case study for the trimethylaluminum/water process. J Appl Phys 2005; 97, 121301.
    • (2005) J Appl Phys , vol.97 , pp. 121301
    • Puurunen, R.L.1
  • 8
    • 0141567439 scopus 로고    scopus 로고
    • Conformal coating on Ultrahigh-Aspect-Ratio Nanopores of Anodic Alumina by Atomic Layer Deposition
    • Elam JW, Routkevitch D, Mardilovich PP, George SM. Conformal coating on Ultrahigh-Aspect-Ratio Nanopores of Anodic Alumina by Atomic Layer Deposition. Chem Mater 2003; 15, p. 3507-3517.
    • (2003) Chem Mater , vol.15 , pp. 3507-3517
    • Elam, J.W.1    Routkevitch, D.2    Mardilovich, P.P.3    George, S.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.