Proximity projection grating structured light illumination microscopy

Applied Optics

Volumn 49, Issue 34, 2010, Pages 6570-6576

  See, Chung W ^a   Chuang, Chin Jung ^a   Liu, Shugang ^a,b   Somekh, Michael G ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b HEILONGJIANG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR PHYSICS; OPTICS;

CLOSE PROXIMITY; FRINGE PATTERN; GRATING VECTORS; IMAGING NA; LATERAL RESOLUTION; OPTICAL ARRANGEMENT; STRUCTURED ILLUMINATION; STRUCTURED LIGHT;

FLUORESCENCE MICROSCOPY;

EID: 78650439983     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.006570     Document Type: Article

References (13)

1. R. Heintzmann and C. Cremer, "Laterally modulated excitation microscopy: Improvement of resolution by using a diffraction grating," Proc. SPIE 3568, 185-196 (1999).
2. M. G. L. Gustafsson, "Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy," J. Microsc. 198, 82-87 (2000).
3. S. W. Hell and Jan Wichmann, "Breaking the diffraction resolution limit by stimulated emission: stimulated-emissiondepletion fluorescence microscopy," Opt. Lett. 19, 780-782 (1994).
4. S. W. Hell, E. H. K. Stelzer, S. Lindek, and C. Cremer, "Confocal microscopy with an increased detection aperture: type-B 4Pi confocal microscopy," Opt. Lett. 19, 222-224 (1994).
5. M. G. L. Gustafsson, D. A. Agard, and J. W. Sedat, "I5M: 3D widefield light microscopy with better than 100 nm axial resolution," J. Microsc. 195, 10-16 (1999).
6. B. Bailey, D. L. Farkas, D. L. Taylor, and F. Lanni, "Enhancement of axial resolution in fluorescence microscopy by standing- wave excitation," Nature 366, 44-48 (1993).
7. M. G. Somekh, K. Hsu, and M. C. Pitter, "Resolution in structured illumination microscopy: a probabilistic approach," J. Opt. Soc. Am. 25, 1319-1329 (2008).
8. S. Liu, C. J. Chuang, C. W. See, G. Zoriniants, W. L. Barnes, and M. G. Somekh, "Double-grating-structured light microscope using plasmonic nanoparticle arrays," Opt. Lett. 34, 1255-1257 (2009).
9. The value of the k-vector is normalized with respect to 2π/λ so that it has a maximum value of 1 in air.
10. A. Sentenac, K. Belkebir, H. Giovannini, and P. C. Chaumet, "Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate," Opt. Lett. 33, 255-257 (2008).
11. J. W. Goodman, Introduction to Fourier Optics (Roberts & Co., 2004).
12. 2 thin films with variable refractive index prepared by ion beaminduced and plasma enhanced chemical vapour deposition," Thin Solid Films 500, 19-26 (2006).
13. J. K. Consulting, "Thin film design and applications," http://www.kruschwitz.com/materials.htm.