Resolution in structured illumination microscopy: A probabilistic approach

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 25, Issue 6, 2008, Pages 1319-1329

  Somekh, Michael G ^a   Hsu, Ken ^a   Pitter, Mark C ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONFOCAL MICROSCOPY; ELECTROMAGNETIC WAVES; FLUORESCENCE; FLUORESCENCE MICROSCOPY; LIGHT EMISSION; LUMINESCENCE; PHOTONS; PROBABILITY; SIGNAL TO NOISE RATIO;

STRUCTURED ILLUMINATION;

MICROSCOPIC EXAMINATION;

EID: 50449100222     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.25.001319     Document Type: Article

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