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Volumn 33, Issue 3, 2008, Pages 255-257
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Subdiffraction resolution in total internal reflection fluorescence microscopy with a grating substrate
a
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Author keywords
[No Author keywords available]
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Indexed keywords
PROBE SCANNING;
SUBDIFFRACTION RESOLUTION;
TOTAL INTERNAL REFLECTION FLUORESCENCE MICROSCOPY;
DIFFRACTION GRATINGS;
FLUORESCENCE;
IMAGE RECONSTRUCTION;
OPTICAL MICROSCOPY;
OPTICAL RESOLVING POWER;
SCANNING;
IMAGING SYSTEMS;
NANOMATERIAL;
NANOPARTICLE;
ARTICLE;
CONFOCAL MICROSCOPY;
DIFFUSION;
EQUIPMENT DESIGN;
FLUORESCENCE MICROSCOPY;
IMAGE PROCESSING;
INSTRUMENTATION;
METHODOLOGY;
NANOTECHNOLOGY;
OPTICS;
STATISTICAL MODEL;
SURFACE PROPERTY;
THEORETICAL MODEL;
DIFFUSION;
EQUIPMENT DESIGN;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, CONFOCAL;
MICROSCOPY, FLUORESCENCE;
MODELS, STATISTICAL;
MODELS, THEORETICAL;
NANOPARTICLES;
NANOSTRUCTURES;
NANOTECHNOLOGY;
OPTICS;
SURFACE PROPERTIES;
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EID: 40149105836
PISSN: 01469592
EISSN: None
Source Type: Journal
DOI: 10.1364/OL.33.000255 Document Type: Article |
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Times cited : (19)
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References (21)
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