Stable bipolar surface potential behavior of copper-doped zinc oxide films studied by Kelvin probe force microscopy

Applied Physics Letters

Volumn 97, Issue 23, 2010, Pages

  Wong, Meng Fei ^a   Herng, Tun Seng ^a   Zhang, Zhongkun ^a   Zeng, Kaiyang ^a   Ding, Jun ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT CONDITIONS; CU FILMS; CU IONS; DC BIAS; KELVIN PROBE FORCE MICROSCOPY; LOCALIZED HOLES; POTENTIAL CHARGE; ZNO; ZNO FILMS;

COPPER; HEAVY IONS; METALLIC FILMS; OXYGEN; OXYGEN VACANCIES; PROBES; SURFACE POTENTIAL; SURFACE PROPERTIES; ZINC; ZINC OXIDE;

OXIDE FILMS;

EID: 78650331955     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3521281     Document Type: Article

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