Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photoemission spectroscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 619, Issue 1-3, 2010, Pages 94-97

  Petravic, M ^a   Peter, R ^a   Fan, L J ^b   Yang, Y W ^b   Chen, Y ^c  

^a University of Rijeka   (Croatia)

^b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^c DEAKIN UNIVERSITY   (Australia)

Author keywords

Boron nitride; Ion bombardment; NEXAFS; Nitrogen vacancy; XPS

Indexed keywords

ATOMIC PHYSICS; BORON NITRIDE; NITRIDES; NITROGEN; PHOTOELECTRON SPECTROSCOPY; VACANCIES; X RAY ABSORPTION; X RAY PHOTOELECTRON SPECTROSCOPY;

HEXAGONAL BORON NITRIDE (H-BN); HIGH-RESOLUTION MEASUREMENTS; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURES; NEXAFS; NITROGEN VACANCIES; VIBRATIONAL FINE STRUCTURE; X RAY PHOTOEMISSION SPECTROSCOPY;

ION BOMBARDMENT;

EID: 78650295647     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.10.118     Document Type: Conference Paper

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