Direct observation of defect levels in InN by soft X-ray absorption spectroscopy

Journal of Physical Chemistry B

Volumn 110, Issue 7, 2006, Pages 2984-2987

  Petravic, M ^a   Deenapanray, P N K ^a   Fraser, M D ^a   Soldatov, A V ^b   Yang, Y W ^c   Anderson, P A ^d   Durbin, S M ^d  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b SOUTHERN FEDERAL UNIVERSITY   (Russian Federation)

^c NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER   (Taiwan)

^d UNIVERSITY OF CANTERBURY   (New Zealand)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; COMPUTER SIMULATION; ELECTRONIC STRUCTURE; NITROGEN; X RAY SPECTROSCOPY;

CONDUCTION BAND MINIMUM (CBM); DEFECT LEVELS;

INDIUM COMPOUNDS;

EID: 33644884717     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp057140l     Document Type: Article

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