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Volumn 68, Issue 20, 1996, Pages 2816-2818

Near-edge x-ray absorption fine structure study of bonding modifications in BN thin films by ion implantation

Author keywords

[No Author keywords available]

Indexed keywords


EID: 1842712666     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116334     Document Type: Article
Times cited : (107)

References (16)
  • 16
    • 21544433595 scopus 로고    scopus 로고
    • J. Stöhr, NEXAFS Spectroscopy (Springer, New York, 1992).
    • J. Stöhr, NEXAFS Spectroscopy (Springer, New York, 1992).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.