Quantitative analysis of the interaction between an atomic force microscopy tip and a hydrophobic monolayer

Journal of Physical Chemistry C

Volumn 114, Issue 49, 2010, Pages 21572-21578

  Ptak, Arkadiusz ^a   Gojzewski, Hubert ^a   Kappl, Michael ^b   Butt, Hans Jürgen ^b  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

1-DODECANETHIOL; ADHESION FORCES; ADHESIVE INTERACTION; ATOMIC FORCE MICROSCOPES; COOPERATIVITY; HYDROPHOBIC MONOLAYERS; INTERACTION POTENTIALS; LOADING RATE; MICROSCOPIC MODELS; QUANTITATIVE ANALYSIS; TRANSITION STATE; TWO-REGIME; VAN DER WAALS BONDS;

ATOMIC FORCE MICROSCOPY; LOADING; SELF ASSEMBLED MONOLAYERS; SILICON NITRIDE; VAN DER WAALS FORCES;

ADHESION;

EID: 78650271046     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp107948q     Document Type: Article

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