Characterization of nanoscale adhesion between a fluoroalkyl silane monolayer and a silicon AFM tip. Complex character of the interaction potential

Chemical Physics Letters

Volumn 489, Issue 1-3, 2010, Pages 54-58

  Ptak, A ^a   Makowski, M ^a   Cichomski, M ^b  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF LODZ   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION FORCES; AFM TIP; ATOMIC FORCE MICROSCOPES; BOUND STATE; COMPLEX CHARACTER; INTERACTION POTENTIALS; LOADING RATE; NANOADHESION; NANOSCALE ADHESION; QUANTITATIVE INFORMATION; SILANE MONOLAYERS; SILICON TIPS; THERMALLY ACTIVATED ESCAPE; TRANSITION STATE; TRICHLOROSILANES; VAN DER WAALS INTERACTIONS;

ADHESION; BROWNIAN MOVEMENT; MONOLAYERS; SELF ASSEMBLY; VAN DER WAALS FORCES;

COMPLEXATION;

EID: 77949484844     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2010.02.043     Document Type: Article

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