Characterization of laser edge isolation in multicrystalline silicon solar cells

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 1721-1726

  Jiang, C S ^a   Moutinho, H R ^a   Johnston, S ^a   Yan, Y ^a   Al Jassim, M M ^a   Gorman, J ^b   Blosse, A ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b Calisolar Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AMORPHOUS STRUCTURES; CHARACTERIZATION STUDIES; CONDUCTIVE ATOMIC FORCE MICROSCOPY; EDGE ISOLATION; ELECTRICAL CHARACTERIZATION; ELECTRON BACKSCATTERING DIFFRACTION; HIGH TEMPERATURE; LOCKIN THERMOGRAPHY; MULTI-CRYSTALLINE SILICON SOLAR CELLS; MULTICRYSTALLINE SILICON (MC-SI); POLYCRYSTALLINE; SCANNING CAPACITANCE MICROSCOPY; SEM; SEM OBSERVATION; SI-PARTICLE;

ABLATION; AMORPHOUS SILICON; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; CHARACTERIZATION; FAILURE ANALYSIS; MOLTEN MATERIALS; PHOTOVOLTAIC EFFECTS; POLYSILICON; QUALITY ASSURANCE; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS;

CRYSTAL ATOMIC STRUCTURE;

EID: 78650141512     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5616118     Document Type: Conference Paper

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