Electron backscatter diffraction of CdTe thin films: Effects of CdCl2 treatment

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 26, Issue 4, 2008, Pages 1068-1073

  Moutinho, H R ^a   Dhere, R G ^a   Romero, M J ^a   Jiang, C S ^a   To, B ^a   Al Jassim, M M ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

(1 1 0) SURFACE; (111) TEXTURE; AMORPHOUS LAYERS; ANALYTICAL TECHNIQUES; ATOMIC FORCE (AF); CLOSE-SPACED SUBLIMATION (CSS); CRYSTALLINE STRUCTURES; DEPOSITION METHODS; ELECTRON BACK SCATTER DIFFRACTION (EBSD); ENERGY SURFACES; GRAIN SIZES; HIGH QUALITY (HQ); HIGH-DENSITY; ION BEAM MILLING (IBM); KIKUCHI PATTERNS; LARGE GRAINS; ORIENTED GRAINS; RECRYSTALLIZATION PROCESS; SURFACE PREPARATIONS; TWIN BOUNDARIES;

AGRICULTURAL PRODUCTS; ATOMIC FORCE MICROSCOPY; BACKSCATTERING; CADMIUM ALLOYS; CADMIUM COMPOUNDS; DIFFRACTION; ELECTRON DIFFRACTION; FILM PREPARATION; GRAIN (AGRICULTURAL PRODUCT); GRAIN SIZE AND SHAPE; ION BEAMS; METALLIZING; MICROSCOPIC EXAMINATION; MILLING (MACHINING); PHOTOACOUSTIC EFFECT; POLISHING; RECRYSTALLIZATION (METALLURGY); SCANNING PROBE MICROSCOPY; SEMICONDUCTING CADMIUM TELLURIDE; SOLIDS; TEXTURES; THICK FILMS; THIN FILMS;

VAPOR DEPOSITION;

EID: 46449086067     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2841523     Document Type: Article

References (11)

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