SCOPUS 정보 검색 플랫폼

2003 International Symposium on System-on-Chip, SoC 2003 - Proceedings

Volumn , Issue , 2003, Pages 143-146

Loopback BiST for RF front-ends in digital transceivers

Author keywords

[No Author keywords available]

Indexed keywords

AD CONVERTERS; DESIGN ABSTRACTIONS; DIGITAL TRANSCEIVERS; EXTERNAL DISTURBANCES; FAULT MODES; FUNCTIONAL BLOCK; FUNCTIONAL LEVELS; GSM TRANSCEIVERS; MASS PRODUCTION; ON CHIPS; RF BLOCKS; RF FRONT END; RF-CMOS; SPOT DEFECTS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; BUILT-IN SELF TEST; TRANSCEIVERS;

PROGRAMMABLE LOGIC CONTROLLERS;

EID: 78650073780 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (5)

References (10)

1
- 0031208797
- Integrated Circuits Testing for Quality Assurance in Manufacturing: History, Current Status, and Future Trends
- Aug.
- A.Grochowski, et al, "Integrated Circuits Testing for Quality Assurance in Manufacturing: History, Current Status, and Future Trends", IEEE Trans.CAS-II: Analog and Digital Signal Proc., Vol.44, No.8, Aug.1997, pp. 610-633
- (1997) IEEE Trans.CAS-II: Analog and Digital Signal Proc. , vol.44 , Issue.8 , pp. 610-633
- Grochowski, A.¹

2
- 0029546326
- Industrial Relevance of Analog IFA: A Fact or a Fiction
- M.Sachdev, B.Atzema, " Industrial Relevance of Analog IFA: A Fact or a Fiction", IEEE Intl. Test Conf., 1995, pp.61-70
- IEEE Intl. Test Conf., 1995 , pp. 61-70
- Sachdev, M.¹ Atzema, B.²

3
- 0030409505
- Realistic Fault Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits
- M.J.Ohletz, "Realistic Fault Mapping Scheme for the Fault Simulation of Integrated Analogue CMOS Circuits", IEEE Intl. Test Conf., 1996, pp.776-785
- IEEE Intl. Test Conf., 1996 , pp. 776-785
- Ohletz, M.J.¹

4
- 0032308287
- Defect-Oriented Testing of Mixed-Signal ICs: Some Industrial Experience
- Y.Xing, "Defect-Oriented Testing of Mixed-Signal ICs: Some Industrial Experience", IEEE Intl. Test Conf., 1998, pp.678-687
- IEEE Intl. Test Conf., 1998 , pp. 678-687
- Xing, Y.¹

5
- 0029543052
- A Built-in-Self-Test Strategy for Wireless Communication Systems
- B.Veillette, G.Roberts, "A Built-in-Self-Test Strategy for Wireless Communication Systems", Proc. ITC, 1995, pp. 930-939
- Proc. ITC, 1995 , pp. 930-939
- Veillette, B.¹ Roberts, G.²

6
- 0030650384
- Challenges and Approaches in Mixed Signal RF Testing
- M.Soma, "Challenges and Approaches in Mixed Signal RF Testing", Proc. ASIC Conf.& Exhibit, 1977, pp.33-37
- Proc. ASIC Conf.& Exhibit, 1977 , pp. 33-37
- Soma, M.¹

7
- 0035119967
- Hierarchical ATPG for Analog Circuits and Systems
- Jan.-Feb.
- M.Soma et al., Hierarchical ATPG for Analog Circuits and Systems, IEEE Design & Test of Computers, Jan.-Feb.2001, pp. 72-81
- (2001) IEEE Design & Test of Computers , pp. 72-81
- Soma, M.¹

8
- 0036446488
- Architecting Millisecond Test solutions for Wireless Phone RFIC's
- J.Ferrario et al., "Architecting Millisecond Test solutions for Wireless Phone RFIC's", IEEE Intl. Test Conf., 2002, pp.1151-1158
- IEEE Intl. Test Conf., 2002 , pp. 1151-1158
- Ferrario, J.¹

9
- 33747056651
- RF-BiST: Loopback Spectral signature Analysis
- D.Lupea et al., "RF-BiST : Loopback Spectral signature Analysis", Proc. DATE'03, 6 pp.
- Proc. DATE'03 , pp. 6
- Lupea, D.¹

10
- 78650036650
- Noise Analysis of Down-conversion Sampling Mixer
- D.Jakonis, J.Dabrowski, C.Svensson, "Noise Analysis of Down-conversion Sampling Mixer", Proc. ECCTD'03, 4 pp.
- Proc. ECCTD'03 , pp. 4
- Jakonis, D.¹ Dabrowski, J.² Svensson, C.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.