Industrial relevance of analog IFA: a fact or a fiction

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 61-70

  Sachdev, Mano ^a   Atzema, Bert ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MACROS; PERFORMANCE; QUALITY ASSURANCE; SPECIFICATIONS;

ANALOG CIRCUIT; INDUCTIVE FAULT ANALYSIS; ROBUST ANALOG DESIGN; STRUCTURAL TEST GENERATION; TEST COST REDUCTION; TEST QUALITY IMPROVEMENT; TEST SIMPLIFICATION;

LINEAR INTEGRATED CIRCUITS;

EID: 0029546326     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (28)