Defect-oriented testing of mixed-signal ICs: Some industrial experience

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 678-687

  Xing, Y ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS;

DEFECT ORIENTED TESTING; MIXED SIGNAL INTEGRATED CIRCUITS;

INTEGRATED CIRCUIT TESTING;

EID: 0032308287     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)