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Volumn , Issue , 2010, Pages 52-56

GaN-on-Si technology, a new approach for advanced devices in energy and communications

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF FREEDOM; GAN LAYERS; GROWTH OF GAN; HETEROGENEOUS INTEGRATION; HIGH VOLTAGE SWITCHES; NEW APPROACHES; NEW DEVICES; NEW OPPORTUNITIES; NITRIDE-BASED DEVICES; ON CHIPS; SI DEVICES; SI SUBSTRATES; SI TECHNOLOGY; SI WAFER;

EID: 78649960223     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2010.5617745     Document Type: Conference Paper
Times cited : (31)

References (8)
  • 1
    • 72049097414 scopus 로고    scopus 로고
    • Seamless on-wafer integration of Si(100) MOSFETs and GaN HEMTs
    • Oct.
    • J. Chung, J. Lee, E. Piner, and T. Palacios, "Seamless On-Wafer Integration of Si(100) MOSFETs and GaN HEMTs, " IEEE Electron Device Letters, vol. 30, Oct. 2009, pp. 1015-1017.
    • (2009) IEEE Electron Device Letters , vol.30 , pp. 1015-1017
    • Chung, J.1    Lee, J.2    Piner, E.3    Palacios, T.4
  • 2
    • 59649124692 scopus 로고    scopus 로고
    • N-Face GaN/AlGaN HEMTs fabricated through layer transfer technology
    • J. Chung, E. Piner, and T. Palacios, "N-Face GaN/AlGaN HEMTs Fabricated Through Layer Transfer Technology, " IEEE Electron Device Letters, vol. 30, 2009, pp. 113-116.
    • (2009) IEEE Electron Device Letters , vol.30 , pp. 113-116
    • Chung, J.1    Piner, E.2    Palacios, T.3
  • 3
    • 77956105850 scopus 로고    scopus 로고
    • High breakdown (>1500 V) AlGaN/GaN\line HEMTs by substrate transfer technology
    • (in press)
    • B. Lu and T. Palacios, "High Breakdown (>1500 V) AlGaN/GaN\line HEMTs by Substrate Transfer Technology, " IEEE Electron Device Letters (in press).
    • IEEE Electron Device Letters
    • Lu, B.1    Palacios, T.2
  • 4
    • 0001473741 scopus 로고    scopus 로고
    • AlGaN/GaN HEMTs-an overview of device operation and applications
    • U.K. Mishra, P. Parikh, Y.F. Wu, and others, "AlGaN/GaN HEMTs-an overview of device operation and applications, " Proceedings of the IEEE, vol. 90, 2002, pp. 1022-1031.
    • (2002) Proceedings of the IEEE , vol.90 , pp. 1022-1031
    • Mishra, U.K.1    Parikh, P.2    Wu, Y.F.3
  • 7
    • 39349111174 scopus 로고    scopus 로고
    • Influence of the substrate misorientation on the properties of N-polar GaN films grown by metal organic chemical vapor deposition
    • S. Keller, N.A. Fichtenbaum, F. Wu, D. Brown, A. Rosales, S.P. DenBaars, J.S. Speck, and U.K. Mishra, "Influence of the substrate misorientation on the properties of N-polar GaN films grown by metal organic chemical vapor deposition, " Journal of Applied Physics, vol. 102, 2007, p. 083546.
    • (2007) Journal of Applied Physics , vol.102 , pp. 083546
    • Keller, S.1    Fichtenbaum, N.A.2    Wu, F.3    Brown, D.4    Rosales, A.5    Denbaars, S.P.6    Speck, J.S.7    Mishra, U.K.8


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.