Growth and characterization of thermally evaporated ATO nanowires

Thin Solid Films

Volumn 519, Issue 5, 2010, Pages 1749-1754

  Lee, Po Sheng ^a   Lin, Yu Hung ^a   Chang, Yee Shyi ^a   Wu, Jyh Ming ^b   Shih, Han C ^a,c  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b FENG CHIA UNIVERSITY   (Taiwan)

^c CHINESE CULTURE UNIVERSITY   (Taiwan)

Author keywords

Nanostructures; Sb doped SnO2 (ATO); Tin oxide (SnO2)

Indexed keywords

ALUMINA SUBSTRATES; CHEMICAL COMPOSITIONS; ELECTRICAL CONDUCTANCE; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; NANOWIRE FILMS; SB-DOPED SNO; SENSING PROPERTY; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPES; FIELD EMISSION; NANOWIRES; OPTOELECTRONIC DEVICES; PHOTONS; SCANNING ELECTRON MICROSCOPY; SPECTROMETERS; THERMAL EVAPORATION; TIN; TIN OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRIC WIRE;

EID: 78649743148     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.08.084     Document Type: Conference Paper

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