Four-probe electrical-transport measurements on single indium tin oxide nanowires between 1.5 and 300 K

Nanotechnology

Volumn 20, Issue 10, 2009, Pages

  Chiu, Shao Pin ^a   Chung, Hui Fang ^b   Lin, Yong Han ^a   Kai, Ji Jung ^b   Chen, Fu Rong ^b   Lin, Juhn Jong ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AS-GROWN; ELECTRON-BEAM LITHOGRAPHIES; INDIUM TIN OXIDES; LOW TEMPERATURES; SINGLE-CRYSTALLINE; SUB MICRONS; TEMPERATURE BEHAVIORS; THERMAL EVAPORATION METHODS; TRANSPORT MEASUREMENTS;

ELECTRIC WIRE; INDIUM; NANOWIRES; PHOTOLITHOGRAPHY; POINT DEFECTS; PROBES; TIN; TITANIUM COMPOUNDS;

THERMAL EVAPORATION;

GOLD; INDIUM TIN OXIDE; INDIUM TIN OXIDE NANOWIRE; NANOWIRE; TITANIUM; UNCLASSIFIED DRUG; NANOMATERIAL; TIN DERIVATIVE;

ARTICLE; ELECTRIC RESISTANCE; ELECTRODE; ELECTRON BEAM; ENERGY; MECHANICAL PROBE; PRIORITY JOURNAL; TEMPERATURE; VAPORIZATION; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; ELECTRON TRANSPORT; IMPEDANCE; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC IMPEDANCE; ELECTRON TRANSPORT; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SURFACE PROPERTIES; TEMPERATURE; TIN COMPOUNDS;

EID: 65449167262     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/10/105203     Document Type: Article

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