-
1
-
-
34547850195
-
Shear stress measurements on InAs nanowires by AFM manipulation
-
DOI 10.1002/smll.200700052
-
M. Bordag, A. Ribayrol, G. Conache, L. E. Fröberg, S. Gray, L. Samuelson, L. Montelius, and H. Pettersson, Small SMALBC 1613-6810 3, 1398 (2007). 10.1002/smll.200700052 (Pubitemid 47245535)
-
(2007)
Small
, vol.3
, Issue.8
, pp. 1398-1401
-
-
Bordag, M.1
Ribayrol, A.2
Conache, G.3
Froberg, L.E.4
Gray, S.5
Samuelson, L.6
Montelius, L.7
Pettersson, H.8
-
2
-
-
59449088953
-
-
SMALBC 1613-6810,. 10.1002/smll.200800794
-
G. Conache, S. M. Gray, A. Ribayrol, L. E. Fröberg, L. Samuelson, H. Pettersson, and L. Montelius, Small SMALBC 1613-6810 5, 203 (2009). 10.1002/smll.200800794
-
(2009)
Small
, vol.5
, pp. 203
-
-
Conache, G.1
Gray, S.M.2
Ribayrol, A.3
Fröberg, L.E.4
Samuelson, L.5
Pettersson, H.6
Montelius, L.7
-
3
-
-
0005681276
-
Adsorbed layers and the origin of static friction
-
DOI 10.1126/science.284.5420.1650
-
G. He, M. H. Müser, and M. O. Robbins, Science SCIEAS 0036-8075 284, 1650 (1999). 10.1126/science.284.5420.1650 (Pubitemid 29291370)
-
(1999)
Science
, vol.284
, Issue.5420
, pp. 1650-1652
-
-
Gang, H.1
Muser, M.H.2
Robbins, M.O.3
-
4
-
-
0000941820
-
-
LANGD5 0743-7463,. 10.1021/la9505576
-
M. O. Robbins and E. D. Smith, Langmuir LANGD5 0743-7463 12, 4543 (1996). 10.1021/la9505576
-
(1996)
Langmuir
, vol.12
, pp. 4543
-
-
Robbins, M.O.1
Smith, E.D.2
-
6
-
-
79955991177
-
One-dimensional heterostructures in semiconductor nanowhiskers
-
DOI 10.1063/1.1447312
-
M. T. Björk, B. J. Ohlsson, T. Sass, A. I. Persson, C. Thelander, M. H. Magnusson, K. Deppert, L. R. Wallenberg, and L. Samuelson, Appl. Phys. Lett. APPLAB 0003-6951 80, 1058 (2002). 10.1063/1.1447312 (Pubitemid 34168059)
-
(2002)
Applied Physics Letters
, vol.80
, Issue.6
, pp. 1058
-
-
Bjork, M.T.1
Ohlsson, B.J.2
Sass, T.3
Persson, A.I.4
Thelander, C.5
Magnusson, M.H.6
Deppert, K.7
Wallenberg, L.R.8
Samuelson, L.9
-
7
-
-
0036643642
-
Improving stamps for 10 nm level wafer scale nanoimprint lithography
-
DOI 10.1016/S0167-9317(02)00464-1, PII S0167931702004641
-
M. Beck, M. Graczyk, I. Maximov, E. -L. Sarwe, T. G. I. Ling, M. Keil, and L. Montelius, Microelectron. Eng. MIENEF 0167-9317 61-62, 441 (2002). 10.1016/S0167-9317(02)00464-1 (Pubitemid 34613399)
-
(2002)
Microelectronic Engineering
, vol.61-62
, pp. 441-448
-
-
Beck, M.1
Graczyk, M.2
Maximov, I.3
Sarwe, E.-L.4
Ling, T.G.I.5
Keil, M.6
Montelius, L.7
-
8
-
-
70349487352
-
-
APPLAB 0003-6951,. 10.1063/1.3225150
-
M. Lexholm, I. Karlsson, F. Boxberg, and D. Hessman, Appl. Phys. Lett. APPLAB 0003-6951 95, 113103 (2009). 10.1063/1.3225150
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 113103
-
-
Lexholm, M.1
Karlsson, I.2
Boxberg, F.3
Hessman, D.4
-
10
-
-
21744449052
-
Thermal resistance of nanowire-plane interfaces
-
DOI 10.1115/1.1865217
-
V. Bahadur, J. Xu, Y. Liu, and T. S. Fisher, Trans. ASME TASMAV 0097-6822 127, 664 (2005). 10.1115/1.1865217 (Pubitemid 40945679)
-
(2005)
Journal of Heat Transfer
, vol.127
, Issue.6
, pp. 664-668
-
-
Bahadur, V.1
Xu, J.2
Liu, Y.3
Fisher, T.S.4
-
11
-
-
68349144487
-
-
APPLAB 0003-6951,. 10.1063/1.3193551
-
D. Dietzel, M. Feldmann, H. Fuchs, U. D. Schwartz, and A. Schirmeisen, Appl. Phys. Lett. APPLAB 0003-6951 95, 053104 (2009). 10.1063/1.3193551
-
(2009)
Appl. Phys. Lett.
, vol.95
, pp. 053104
-
-
Dietzel, D.1
Feldmann, M.2
Fuchs, H.3
Schwartz, U.D.4
Schirmeisen, A.5
-
12
-
-
0031079324
-
-
PRLTAO 0031-9007,. 10.1103/PhysRevLett.78.1448
-
M. Hirano, K. Shinjo, R. Kaneko, and Y. Murata, Phys. Rev. Lett. PRLTAO 0031-9007 78, 1448 (1997). 10.1103/PhysRevLett.78.1448
-
(1997)
Phys. Rev. Lett.
, vol.78
, pp. 1448
-
-
Hirano, M.1
Shinjo, K.2
Kaneko, R.3
Murata, Y.4
-
13
-
-
0001075932
-
-
SCIEAS 0036-8075,. 10.1126/science.272.5265.1158
-
P. E. Sheehan and C. M. Lieber, Science SCIEAS 0036-8075 272, 1158 (1996). 10.1126/science.272.5265.1158
-
(1996)
Science
, vol.272
, pp. 1158
-
-
Sheehan, P.E.1
Lieber, C.M.2
-
14
-
-
27144518405
-
Nucleation time of nanoscale water bridges
-
DOI 10.1103/PhysRevLett.95.135502, 135502
-
R. Szoszkiewicz and E. Riedo, Phys. Rev. Lett. PRLTAO 0031-9007 95, 135502 (2005). 10.1103/PhysRevLett.95.135502 (Pubitemid 41505585)
-
(2005)
Physical Review Letters
, vol.95
, Issue.13
, pp. 1-4
-
-
Szoszkiewicz, R.1
Riedo, E.2
-
15
-
-
0343681011
-
-
PRLTAO 0031-9007,. 10.1103/PhysRevLett.59.1942
-
C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. PRLTAO 0031-9007 59, 1942 (1987). 10.1103/PhysRevLett.59.1942
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 1942
-
-
Mate, C.M.1
McClelland, G.M.2
Erlandsson, R.3
Chiang, S.4
-
16
-
-
0043039452
-
-
CHREAY 0009-2665,. 10.1021/cr960068q
-
R. W. Carpick and M. Salmeron, Chem. Rev. CHREAY 0009-2665 97, 1163 (1997). 10.1021/cr960068q
-
(1997)
Chem. Rev.
, vol.97
, pp. 1163
-
-
Carpick, R.W.1
Salmeron, M.2
-
17
-
-
2342613400
-
-
PRLTAO 0031-9007,. 10.1103/PhysRevLett.92.134301
-
A. Socoliuc, R. Bennewitz, E. Gnecco, and E. Meyer, Phys. Rev. Lett. PRLTAO 0031-9007 92, 134301 (2004). 10.1103/PhysRevLett.92.134301
-
(2004)
Phys. Rev. Lett.
, vol.92
, pp. 134301
-
-
Socoliuc, A.1
Bennewitz, R.2
Gnecco, E.3
Meyer, E.4
-
18
-
-
2042493009
-
-
JPCHAX 0022-3654,. 10.1021/j100118a033
-
H. Yoshizawa, Y. -L. Chen, and J. Israelachvili, J. Phys. Chem. JPCHAX 0022-3654 97, 4128 (1993). 10.1021/j100118a033
-
(1993)
J. Phys. Chem.
, vol.97
, pp. 4128
-
-
Yoshizawa, H.1
Chen, Y.-L.2
Israelachvili, J.3
-
19
-
-
33749178498
-
-
JPCHAX 0022-3654,. 10.1021/j100145a031
-
H. Yoshizawa and J. Israelachvili, J. Phys. Chem. JPCHAX 0022-3654 97, 11300 (1993). 10.1021/j100145a031
-
(1993)
J. Phys. Chem.
, vol.97
, pp. 11300
-
-
Yoshizawa, H.1
Israelachvili, J.2
-
20
-
-
0000516794
-
-
PLRBAQ 0556-2805,. 10.1103/PhysRevB.41.11837
-
M. Hirano and K. Shinjo, Phys. Rev. B PLRBAQ 0556-2805 41, 11837 (1990). 10.1103/PhysRevB.41.11837
-
(1990)
Phys. Rev. B
, vol.41
, pp. 11837
-
-
Hirano, M.1
Shinjo, K.2
-
21
-
-
2342452518
-
-
PRLTAO 0031-9007,. 10.1103/PhysRevLett.92.126101
-
M. Dienwiebel, G. S. Verhoeven, N. Pradeep, J. W. M. Frenken, J. A. Heimberg, and H. W. Zandbergen, Phys. Rev. Lett. PRLTAO 0031-9007 92, 126101 (2004). 10.1103/PhysRevLett.92.126101
-
(2004)
Phys. Rev. Lett.
, vol.92
, pp. 126101
-
-
Dienwiebel, M.1
Verhoeven, G.S.2
Pradeep, N.3
Frenken, J.W.M.4
Heimberg, J.A.5
Zandbergen, H.W.6
-
22
-
-
0001918621
-
-
JCOMEL 0953-8984,. 10.1088/0953-8984/2/S/009
-
J. Israelachvili, P. McGuiggan, M. Gee, A. Homola, M. Robbins, and P. Thompson, J. Phys.: Condens. Matter JCOMEL 0953-8984 2, SA89 (1990). 10.1088/0953-8984/2/S/009
-
(1990)
J. Phys.: Condens. Matter
, vol.2
, pp. 89
-
-
Israelachvili, J.1
McGuiggan, P.2
Gee, M.3
Homola, A.4
Robbins, M.5
Thompson, P.6
-
23
-
-
25444433657
-
Evolution of the adsorbed water layer structure on silicon oxide at room temperature
-
DOI 10.1021/jp053042o
-
D. B. Asay and S. H. Kim, J. Phys. Chem. B JPCBFK 1089-5647 109, 16760 (2005). 10.1021/jp053042o (Pubitemid 41367419)
-
(2005)
Journal of Physical Chemistry B
, vol.109
, Issue.35
, pp. 16760-16763
-
-
Asay, D.B.1
Kim, S.H.2
-
24
-
-
0035396190
-
Effects of adsorbed water and sample aging in air on the μN level adhesion force between Si(100) and silicon nitride
-
DOI 10.1016/S0301-679X(01)00047-0, PII S0301679X01000470
-
S. T. Patton, K. C. Eapen, and J. S. Zabinski, Tribol. Int. TRBIBK 0301-679X 34, 481 (2001). 10.1016/S0301-679X(01)00047-0 (Pubitemid 32640130)
-
(2001)
Tribology International
, vol.34
, Issue.7
, pp. 481-491
-
-
Patton, S.T.1
Eapen, K.C.2
Zabinski, J.S.3
-
25
-
-
3242780976
-
-
SSCOA4 0038-1098,. 10.1016/j.ssc.2004.05.033
-
C. Thelander, M. T. Björk, M. W. Larsson, A. E. Hansen, L. R. Wallenberg, and L. Samuelson, Solid State Commun. SSCOA4 0038-1098 131, 573 (2004). 10.1016/j.ssc.2004.05.033
-
(2004)
Solid State Commun.
, vol.131
, pp. 573
-
-
Thelander, C.1
Björk, M.T.2
Larsson, M.W.3
Hansen, A.E.4
Wallenberg, L.R.5
Samuelson, L.6
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