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Volumn 108, Issue 9, 2010, Pages

Analysis of current-driven surface morphological stabilization of a coherently strained epitaxial thin film on a finite-thickness deformable substrate

(3) Sfyris, Georgios I a Gungor, M Rauf a Maroudas, Dimitrios a

a University of Massachusetts (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENEFICIAL EFFECTS; CRITICAL STRENGTH; CURRENT-DRIVEN; EPITAXIAL THIN FILMS; EXTERNAL ELECTRIC FIELD; FIELD STRENGTHS; FILM SURFACES; HETEROEPITAXIAL SYSTEMS; ISLAND FORMATION; MATERIAL PROPERTY; MORPHOLOGICAL EVOLUTION; MORPHOLOGICAL STABILITY; OPTIMAL DIRECTION; PLANAR SURFACE; STRONG ELECTRIC FIELDS; SUBSTRATE MATERIAL; THICK SUBSTRATES;

ELECTRIC FIELDS; ELECTRIC PROPERTIES; EPITAXIAL FILMS; EPITAXIAL GROWTH; FILM THICKNESS; LATTICE MISMATCH; LINEAR STABILITY ANALYSIS; MECHANICAL PROPERTIES; MORPHOLOGY; STABILIZATION; SUBSTRATES; SURFACES; VAPOR DEPOSITION;

SURFACE MORPHOLOGY;

EID: 78649279895 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3494095 Document Type: Article

Times cited : (11)

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