SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 96, Issue 23, 2010, Pages

Electromigration-driven surface morphological stabilization of a coherently strained epitaxial thin film on a substrate

(3) Sfyris, Georgios I a Gungor, M Rauf a Maroudas, Dimitrios a

a University of Massachusetts (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC SUBSTRATE; ELECTRIC-FIELD DIRECTIONS; EPITAXIAL THIN FILMS; FILM SURFACES; MORPHOLOGICAL EVOLUTION; MORPHOLOGICAL INSTABILITY; MORPHOLOGICAL STABILITY; PLANAR FILMS; STRAINED THIN FILMS; SURFACE DIFFUSIONAL ANISOTROPY; SURFACE STABILIZATION;

ELECTRIC DRIVES; ELECTRIC FIELDS; ELECTRIC NETWORK ANALYSIS; ELECTROMIGRATION; LATTICE MISMATCH; LINEAR STABILITY ANALYSIS; STABILIZATION; THIN FILMS;

SURFACE MORPHOLOGY;

EID: 77953493520 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3447371 Document Type: Article

Times cited : (14)

References (23)

1
- 51249188112
- MTBSEO 1073-5615.
- R. J. Asaro and W. A. Tiller, Metall. Mater. Trans. B MTBSEO 1073-5615 3, 1789 (1972).
- (1972) Metall. Mater. Trans. B , vol.3 , pp. 1789
- Asaro, R.J.¹ Tiller, W.A.²

2
- 0000240718
- SPHDA9 0038-5689.
- M. A. Grinfeld, Sov. Phys. Dokl. SPHDA9 0038-5689 31, 831 (1986).
- (1986) Sov. Phys. Dokl. , vol.31 , pp. 831
- Grinfeld, M.A.¹

3
- 0024611337
- AMETAR 0001-6160, () 10.1016/0001-6160(89)90246-0;, Phys. Rev. Lett. PRLTAO 0031-9007 71, 1593 (1993). 10.1103/PhysRevLett.71.1593
- D. J. Srolovitz, Acta Metall. AMETAR 0001-6160 37, 621 (1989) 10.1016/0001-6160(89)90246-0; W. H. Yang and D. J. Srolovitz, Phys. Rev. Lett. PRLTAO 0031-9007 71, 1593 (1993). 10.1103/PhysRevLett.71.1593
- (1989) Acta Metall. , vol.37 , pp. 621
- Srolovitz, D.J.¹ Yang, W.H.² Srolovitz, D.J.³

4
- 3643130905
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.64.1943
- D. J. Eaglesham and M. Cerullo, Phys. Rev. Lett. PRLTAO 0031-9007 64, 1943 (1990). 10.1103/PhysRevLett.64.1943
- (1990) Phys. Rev. Lett. , vol.64 , pp. 1943
- Eaglesham, D.J.¹ Cerullo, M.²

5
- 0345473991
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.77.1330
- D. E. Jesson, K. M. Chen, S. J. Pennycook, T. Thundat, and R. J. Warmack, Phys. Rev. Lett. PRLTAO 0031-9007 77, 1330 (1996). 10.1103/PhysRevLett.77.1330
- (1996) Phys. Rev. Lett. , vol.77 , pp. 1330
- Jesson, D.E.¹ Chen, K.M.² Pennycook, S.J.³ Thundat, T.⁴ Warmack, R.J.⁵

6
- 0000514488
- PRBMDO 0163-1829,. 10.1103/PhysRevB.56.6458
- T. M. Parker, L. K. Wilson, and N. G. Condon, Phys. Rev. B PRBMDO 0163-1829 56, 6458 (1997). 10.1103/PhysRevB.56.6458
- (1997) Phys. Rev. B , vol.56 , pp. 6458
- Parker, T.M.¹ Wilson, L.K.² Condon, N.G.³

7
- 0000261874
- Dynamic self-organization of strained islands during SiGe epitaxial growth
- DOI 10.1063/1.122049, PII S0003695198016337
- J. A. Floro, E. Chason, M. B. Sinclair, L. B. Freund, and G. A. Lucadamo, Appl. Phys. Lett. APPLAB 0003-6951 73, 951 (1998). 10.1063/1.122049 (Pubitemid 128671722)
- (1998) Applied Physics Letters , vol.73 , Issue.7 , pp. 951-953
- Floro, J.A.¹ Chason, E.² Sinclair, M.B.³ Freund, L.B.⁴ Lucadamo, G.A.⁵

8
- 0001693375
- PRLTAO 0031-9007, () 10.1103/PhysRevLett.67.3696;, J. Appl. Phys. JAPIAU 0021-8979 73, 4955 (1993). 10.1063/1.353815
- B. J. Spencer, P. W. Voorhees, and S. H. Davis, Phys. Rev. Lett. PRLTAO 0031-9007 67, 3696 (1991) 10.1103/PhysRevLett.67.3696; B. J. Spencer, P. W. Voorhees, and S. H. Davis, J. Appl. Phys. JAPIAU 0021-8979 73, 4955 (1993). 10.1063/1.353815
- (1991) Phys. Rev. Lett. , vol.67 , pp. 3696
- Spencer, B.J.¹ Voorhees, P.W.² Davis, S.H.³ Spencer, B.J.⁴ Voorhees, P.W.⁵ Davis, S.H.⁶

9
- 0000292637
- PRBMDO 0163-1829,. 10.1103/PhysRevB.47.9760
- B. J. Spencer, S. H. Davis, and P. W. Voorhees, Phys. Rev. B PRBMDO 0163-1829 47, 9760 (1993). 10.1103/PhysRevB.47.9760
- (1993) Phys. Rev. B , vol.47 , pp. 9760
- Spencer, B.J.¹ Davis, S.H.² Voorhees, P.W.³

10
- 0001357314
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.79.4858
- B. J. Spencer and J. Tersoff, Phys. Rev. Lett. PRLTAO 0031-9007 79, 4858 (1997). 10.1103/PhysRevLett.79.4858
- (1997) Phys. Rev. Lett. , vol.79 , pp. 4858
- Spencer, B.J.¹ Tersoff, J.²

11
- 0001178842
- PRLTAO 0031-9007, () 10.1103/PhysRevLett.84.2449;, Appl. Phys. Lett. APPLAB 0003-6951 76, 3022 (2000) 10.1063/1.126566;, Phys. Rev. B PRBMDO 0163-1829 64, 235318 (2001). 10.1103/PhysRevB.64.235318
- B. J. Spencer, P. W. Voorhees, and J. Tersoff, Phys. Rev. Lett. PRLTAO 0031-9007 84, 2449 (2000) 10.1103/PhysRevLett.84.2449; B. J. Spencer, P. W. Voorhees, and J. Tersoff, Appl. Phys. Lett. APPLAB 0003-6951 76, 3022 (2000) 10.1063/1.126566; B. J. Spencer, P. W. Voorhees, and J. Tersoff, Phys. Rev. B PRBMDO 0163-1829 64, 235318 (2001). 10.1103/PhysRevB.64.235318
- (2000) Phys. Rev. Lett. , vol.84 , pp. 2449
- Spencer, B.J.¹ Voorhees, P.W.² Tersoff, J.³ Spencer, B.J.⁴ Voorhees, P.W.⁵ Tersoff, J.⁶ Spencer, B.J.⁷ Voorhees, P.W.⁸ Tersoff, J.⁹

12
- 6744259049
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.85.1922
- A. Li, F. Liu, and M. G. Lagally, Phys. Rev. Lett. PRLTAO 0031-9007 85, 1922 (2000). 10.1103/PhysRevLett.85.1922
- (2000) Phys. Rev. Lett. , vol.85 , pp. 1922
- Li, A.¹ Liu, F.² Lagally, M.G.³

13
- 0037021347
- PRLTAO 0031-9007,. 10.1103/PhysRevLett.89.196104
- J. Tersoff, B. J. Spencer, A. Rastelli, and H. von Känel, Phys. Rev. Lett. PRLTAO 0031-9007 89, 196104 (2002). 10.1103/PhysRevLett.89.196104
- (2002) Phys. Rev. Lett. , vol.89 , pp. 196104
- Tersoff, J.¹ Spencer, B.J.² Rastelli, A.³ Von Känel, H.⁴

14
- 79956041971
- Strain induced stabilization of stepped Si and Ge surfaces near (001)
- DOI 10.1063/1.1491611
- V. B. Shenoy, C. V. Ciobanu, and L. B. Freund, Appl. Phys. Lett. APPLAB 0003-6951 81, 364 (2002). 10.1063/1.1491611 (Pubitemid 34803048)
- (2002) Applied Physics Letters , vol.81 , Issue.2 , pp. 364
- Shenoy, V.B.¹ Ciobanu, C.V.² Freund, L.B.³

15
- 3142603571
- JAPIAU 0021-8979,. 10.1063/1.1751640
- A. Ramasubramaniam and V. B. Shenoy, J. Appl. Phys. JAPIAU 0021-8979 95, 7813 (2004). 10.1063/1.1751640
- (2004) J. Appl. Phys. , vol.95 , pp. 7813
- Ramasubramaniam, A.¹ Shenoy, V.B.²

16
- 9944259108
- JAPIAU 0021-8979, () 10.1063/1.1766084;, J. Appl. Phys. JAPIAU 0021-8979 102, 073503 (2007). 10.1063/1.2785024
- W. T. Tekalign and B. J. Spencer, J. Appl. Phys. JAPIAU 0021-8979 96, 5505 (2004) 10.1063/1.1766084; W. T. Tekalign and B. J. Spencer, J. Appl. Phys. JAPIAU 0021-8979 102, 073503 (2007). 10.1063/1.2785024
- (2004) J. Appl. Phys. , vol.96 , pp. 5505
- Tekalign, W.T.¹ Spencer, B.J.² Tekalign, W.T.³ Spencer, B.J.⁴

17
- 38549136495
- Current-induced stabilization of surface morphology in stressed solids
- DOI 10.1103/PhysRevLett.100.036106
- V. Tomar, M. R. Gungor, and D. Maroudas, Phys. Rev. Lett. PRLTAO 0031-9007 100, 036106 (2008). 10.1103/PhysRevLett.100.036106 (Pubitemid 351161810)
- (2008) Physical Review Letters , vol.100 , Issue.3 , pp. 036106
- Tomar, V.¹ Gungor, M.R.² Maroudas, D.³

18
- 43349099334
- APPLAB 0003-6951, () 10.1063/1.2912037;, Appl. Phys. Lett. APPLAB 0003-6951 94, 181911 (2009). 10.1063/1.3130742
- V. Tomar, M. R. Gungor, and D. Maroudas, Appl. Phys. Lett. APPLAB 0003-6951 92, 181905 (2008) 10.1063/1.2912037; V. Tomar, M. R. Gungor, and D. Maroudas, Appl. Phys. Lett. APPLAB 0003-6951 94, 181911 (2009). 10.1063/1.3130742
- (2008) Appl. Phys. Lett. , vol.92 , pp. 181905
- Tomar, V.¹ Gungor, M.R.² Maroudas, D.³ Tomar, V.⁴ Gungor, M.R.⁵ Maroudas, D.⁶

19
- 0035333784
- Modeling of electromechanically-induced failure of passivated metallic thin films used in device interconnections
- DOI 10.1023/A:1011054731371, Fracture Processes in Microelectronics
- M. R. Gungor and D. Maroudas, Int. J. Fract. IJFRAP 0376-9429 109, 47 (2001). 10.1023/A:1011054731371 (Pubitemid 32516646)
- (2001) International Journal of Fracture , vol.109 , Issue.1 , pp. 47-68
- Gungor, M.R.¹ Maroudas, D.²

20
- 40649107813
- SUSCAS 0039-6028,. 10.1016/j.susc.2008.01.021
- J. S. Cho, M. R. Gungor, and D. Maroudas, Surf. Sci. SUSCAS 0039-6028 602, 1227 (2008). 10.1016/j.susc.2008.01.021
- (2008) Surf. Sci. , vol.602 , pp. 1227
- Cho, J.S.¹ Gungor, M.R.² Maroudas, D.³

21
- 0001586026
- APPLAB 0003-6951,. 10.1063/1.115471
- D. Maroudas, Appl. Phys. Lett. APPLAB 0003-6951 67, 798 (1995). 10.1063/1.115471
- (1995) Appl. Phys. Lett. , vol.67 , pp. 798
- Maroudas, D.¹

22
- 77953523189
- See supplementary material at E-APPLAB-96-049023 for the morphological stability analysis based on the solution of the full electrostatic boundary-value problem in the film with the perturbed surface morphology from the planar state, without using the local approximation for the electric field.
- See supplementary material at http://dx.doi.org/10.1063/1.3447371 E-APPLAB-96-049023 for the morphological stability analysis based on the solution of the full electrostatic boundary-value problem in the film with the perturbed surface morphology from the planar state, without using the local approximation for the electric field.

23
- 18244402184
- PRLTAO 0031-9007, () 10.1103/PhysRevLett.94.166105;, Phys. Rev. B PRBMDO 0163-1829 74, 245423 (2006). 10.1103/PhysRevB.74.245423
- P. Kuhn, J. Krug, F. Hausser, and A. Voigt, Phys. Rev. Lett. PRLTAO 0031-9007 94, 166105 (2005) 10.1103/PhysRevLett.94.166105; M. Rusanen, P. Kuhn, and J. Krug, Phys. Rev. B PRBMDO 0163-1829 74, 245423 (2006). 10.1103/PhysRevB.74.245423
- (2005) Phys. Rev. Lett. , vol.94 , pp. 166105
- Kuhn, P.¹ Krug, J.² Hausser, F.³ Voigt, A.⁴ Rusanen, M.⁵ Kuhn, P.⁶ Krug, J.⁷

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.