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Volumn 3, Issue 10, 2010, Pages
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Dependence of surface-loss probability of hydrogen atom on pressures in very high frequency parallel-plate capacitively coupled plasma
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Author keywords
[No Author keywords available]
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Indexed keywords
AFTERGLOW PLASMAS;
CAPACITIVELY COUPLED PLASMAS;
DECAY TIME CONSTANT;
HIGH-RATE DEPOSITION;
HYDROGEN ATOMS;
LOSS KINETICS;
LOSS PROBABILITY;
MICROCRYSTALLINE SILICON FILMS;
PARALLEL PLATES;
SILICON THIN FILM;
VACUUM ULTRAVIOLETS;
VERY HIGH FREQUENCY;
ABSORPTION SPECTROSCOPY;
ATOMIC SPECTROSCOPY;
DEPOSITION;
HIGH PRESSURE EFFECTS;
HYDROGEN;
INDUCTIVELY COUPLED PLASMA;
MICROCRYSTALLINE SILICON;
PLASMA DEPOSITION;
PROBABILITY;
SEMICONDUCTING SILICON COMPOUNDS;
ULTRAVIOLET LASERS;
ATOMS;
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EID: 78549273659
PISSN: 18820778
EISSN: 18820786
Source Type: Journal
DOI: 10.1143/APEX.3.106001 Document Type: Article |
Times cited : (7)
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References (14)
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