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Volumn 3, Issue 10, 2010, Pages

Dependence of surface-loss probability of hydrogen atom on pressures in very high frequency parallel-plate capacitively coupled plasma

Author keywords

[No Author keywords available]

Indexed keywords

AFTERGLOW PLASMAS; CAPACITIVELY COUPLED PLASMAS; DECAY TIME CONSTANT; HIGH-RATE DEPOSITION; HYDROGEN ATOMS; LOSS KINETICS; LOSS PROBABILITY; MICROCRYSTALLINE SILICON FILMS; PARALLEL PLATES; SILICON THIN FILM; VACUUM ULTRAVIOLETS; VERY HIGH FREQUENCY;

EID: 78549273659     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.3.106001     Document Type: Article
Times cited : (7)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.