Structure of ultrathin silica films on Mo(112) studied via Classical and Quantum Mechanical Rainbow Scattering of Fast Atoms

Surface and Interface Analysis

Volumn 42, Issue 10-11, 2010, Pages 1575-1580

  Seifert, J ^a   Busch, M ^a   Schuller A ^a   Blauth, D ^a   Wethekam, S ^a   Winter, H ^a  

^a HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Atom diffraction; Ion scattering; Structure of surfaces

Indexed keywords

ANALYTICAL TOOL; ATOM DIFFRACTION; ATOM SCATTERING; AXIAL SURFACE CHANNELING; EXPERIMENTAL TECHNIQUES; FILM SURFACES; GRAZING SCATTERING; HE ATOMS; ION SCATTERING; MO(112); QUANTUM MECHANICAL; RAINBOW SCATTERING; SILICA FILM; STRUCTURAL MODELS; STRUCTURE OF SURFACES; SURFACE ATOMS; ULTRA-THIN;

DIFFRACTION; MODEL STRUCTURES; PLASMA INTERACTIONS; QUANTUM THEORY; SCATTERING; SILICA; ULTRATHIN FILMS;

ATOMS;

EID: 78449308033     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3609     Document Type: Conference Paper

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