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Volumn , Issue , 2010, Pages 195-198

Creep behavior investigation of lead-free solder alloy Sn96.5Ag3Cu0.5

Author keywords

[No Author keywords available]

Indexed keywords

CONSTANT STRESS; CREEP BEHAVIORS; CREEP DATA; CREEP PROPERTIES; CREEP TESTS; DEFORMATION RESISTANCE; KEY PARTS; LEAD FREE SOLDERS; LEAD-FREE SOLDER ALLOY; SOLDER ALLOYS; TEMPERATURE SENSITIVITY;

EID: 78449271685     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2010.5582445     Document Type: Conference Paper
Times cited : (3)

References (14)
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  • 3
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    • ASME, EEEP
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    • Lu, M.1    Liu, S.2
  • 5
    • 0030682046 scopus 로고    scopus 로고
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    • Minfu Lu, Wei Ren and Sheng Liu, "Unified multi-axial sub-micron fatigue tester with Applications to Electronic Packaging Materials", Proceedings of the 47th Electronic Components and Technology Conference, 144-148, 1997.
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  • 8
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    • Thermo-mechanical creep of two solder alloys
    • Seattle, Washington
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  • 12
    • 0346216053 scopus 로고    scopus 로고
    • Tensile properties of Sn-Ag based leadfree solders and strain rate sensitivity
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  • 14
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.