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Volumn 36, Issue 1, 1999, Pages 65-78

Investigation of electronic packaging materials by using a 6-axis mini thermo-mechanical tester

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FAILURE ANALYSIS; FATIGUE TESTING; FRACTURE; LASER APPLICATIONS; MONITORING; PLASTIC FILMS; SHEAR DEFORMATION; SOLDERING ALLOYS;

EID: 0032804354     PISSN: 00207683     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0020-7683(97)00281-3     Document Type: Article
Times cited : (41)

References (9)
  • 2
    • 0029378041 scopus 로고
    • Investigation of crack propagation in ceramic\adhesive\glass systems
    • CHMT, Sept.
    • Liu, S., Zhu, J., Hu, J.M., Pao, Y.H., 1995. Investigation of crack propagation in ceramic\adhesive\glass systems, IEEE Trans., CHMT, Sept.
    • (1995) IEEE Trans.
    • Liu, S.1    Zhu, J.2    Hu, J.M.3    Pao, Y.H.4
  • 5
    • 85033955256 scopus 로고    scopus 로고
    • Newport Corporation
    • The Newport Catalog, 96\97, Newport Corporation, 1996.
    • (1996) The Newport Catalog , vol.96-97


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.