Hydrogen in polycrystalline ZnO thin films

Journal of Physics D: Applied Physics

Volumn 43, Issue 36, 2010, Pages

  Kim, W M ^a   Kim, Y H ^a,b   Kim, J S ^a,b   Jeong, J ^a   Baik, Y J ^a   Park, J K ^a   Lee, K S ^a   Seong, T Y ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RELAXATION; CHARGE STATE; EFFECT OF HYDROGEN; FREE CARRIERS; HYDROGEN ADDITION; HYDROGEN INCORPORATION; HYDROGEN INTERSTITIALS; POLYCRYSTALLINE ZNO;

GRAIN BOUNDARIES; HYDROGEN; HYDROGEN BONDS; METALLIC FILMS; OPTICAL FILMS; OXYGEN; PASSIVATION; THIN FILMS; ZINC OXIDE;

OXYGEN VACANCIES;

EID: 78249274588     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/43/36/365406     Document Type: Article

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