Anomalous dielectric peak in Mg and Li doped ZnO ceramics and thin films

Applied Physics Letters

Volumn 97, Issue 19, 2010, Pages

  Soukiassian, A ^a,b   Tagantsev, A ^a   Setter, N ^a  

^a EPFL   (Switzerland)

^b School of Chemical and Molecular Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MEASUREMENTS; DIELECTRIC PEAKS; DOPED ZNO; FERROELECTRIC PHASE TRANSITION; IN-VACUUM; MEASUREMENT ARTIFACTS; MEASUREMENT SYSTEM; PRESENCE OF WATER;

CERAMIC MATERIALS; FERROELECTRIC MATERIALS; PHASE TRANSITIONS; THIN FILMS; VAPOR DEPOSITION; WATER VAPOR;

ZINC OXIDE;

EID: 78249271396     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3505930     Document Type: Article

References (18)

1. R. Weil, R. Nkum, E. Muranevich, and L. Benguigui, Phys. Rev. Lett. 0031-9007 62, 2744 (1989). 10.1103/PhysRevLett.62.2744
2. D. J. Fu, J. C. Lee, S. W. Choi, S. J. Lee, T. W. Kang, M. S. Jang, H. I. Lee, and Y. D. Woo, Appl. Phys. Lett. 0003-6951 81, 5207 (2002). 10.1063/1.1530744
3. I. Stolichnov, E. Colla, N. Setter, T. Wojciechowski, E. Janik, and G. Karczewski, Phys. Rev. Lett. 0031-9007 97, 247601 (2006). 10.1103/PhysRevLett. 97.247601
4. A. Onodera, Ferroelectrics 0015-0193 267, 131 (2002). 10.1080/00150190210997
5. A. Onodera, N. Tamaki, Y. Kawamura, T. Sawada, and H. Yamashita, Jpn. J. Appl. Phys., Part 1 0021-4922 35, 5160 (1996). 10.1143/JJAP.35.5160
6. M. Joseph, H. Tabata, and T. Kawai, Appl. Phys. Lett. 0003-6951 74, 2534 (1999). 10.1063/1.123889
7. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, J. Appl. Phys. 0021-8979 99, 034105 (2006). 10.1063/1.2169508
8. Dhananjay, J. Nagaraju, and S. B. Krupanidhi, J. Appl. Phys. 0021-8979 101, 104104 (2007). 10.1063/1.2722243
9. Y. C. Yang, C. Song, F. Zeng, F. Pan, Y. N. Xie, and T. Liu, Appl. Phys. Lett. 0003-6951 90, 242903 (2007). 10.1063/1.2748081
10. Y. H. Lin, M. H. Ying, M. Li, X. H. Wang, and C. W. Nan, Appl. Phys. Lett. 0003-6951 90, 222110 (2007). 10.1063/1.2745247
11. L. G. Yu, G. M. Zhang, X. Y. Zhao, and D. Z. Guo, Mater. Res. Bull. 0025-5408 44, 589 (2009). 10.1016/j.materresbull.2008.07.003
12. H. K. Yadav, K. Sreenivas, V. Gupta, J. F. Scott, and R. S. Katiyar, Appl. Phys. Lett. 0003-6951 92, 122908 (2008). 10.1063/1.2902172
13. A. K. Tagantsev, Appl. Phys. Lett. 0003-6951 93, 202905 (2008). 10.1063/1.3036537
14. L. Pintilie and M. Alex, Appl. Phys. Lett. 0003-6951 87, 112903 (2005). 10.1063/1.2045543
15. M. Dawber, K. M. Rabe, and J. F. Scott, Rev. Mod. Phys. 0034-6861 77, 1083 (2005). 10.1103/RevModPhys.77.1083
16. Delta Design, Inc. 12367 Crosthwaite Circle, Poway, CA 92064.
17. See for example: S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Mater. Sci. 0079-6425 50, 293 (2005). 10.1016/j.pmatsci.2004.04. 001
18. See for example: C. Wohlfarth, Static Dielectric Constants of Pure Liquids and Binary Liquid Mixtures, Landolt-Börnstein, New Series, Group IV, Vol. 17 (Springer, Berlin, 2008), p. 29.