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Volumn 97, Issue 19, 2010, Pages

The effect of la in InZnO systems for solution-processed amorphous oxide thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE CHANNEL LAYERS; AMORPHOUS OXIDES; BAND GAPS; CHANNEL MOBILITY; METAL-OXYGEN BONDS; MOLE RATIO; OFF-CURRENT; ON/OFF RATIO; SOLUTION-PROCESSED; SUBTHRESHOLD SWING;

EID: 78249266622     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3506503     Document Type: Article
Times cited : (62)

References (18)
  • 15
    • 0003498205 scopus 로고    scopus 로고
    • 0003-6951,. 10.1063/1.122839
    • J. Yu and Y. Namba, Appl. Phys. Lett. 0003-6951 73, 3607 (1998). 10.1063/1.122839
    • (1998) Appl. Phys. Lett. , vol.73 , pp. 3607
    • Yu, J.1    Namba, Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.