The effects of rapid thermal annealing on the electrical, optical, and structural properties of Nb: TiO2 multilayer electrodes with an inserted nanoscale Ag layer for organic solar cells

Journal of Applied Physics

Volumn 108, Issue 8, 2010, Pages

  Park, Jun Hyuk ^a   Choi, Yoon Young ^a   Kim, Han Ki ^a   Lee, Hyun Hwi ^b   Na, Seok In ^c  

^a Kyung Hee University   (South Korea)

^b POSTECH   (South Korea)

^c Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AG DIFFUSION; ANNEALING TEMPERATURES; BAND GAPS; BURSTEIN-MOSS EFFECTS; ELECTRICAL PROPERTY; INTERFACIAL DIFFUSION; LOW RESISTIVITY; MULTILAYER ELECTRODES; NANO SCALE; OPTICAL TRANSMITTANCE; ORGANIC LAYERS; ORGANIC SOLAR CELL; OUT-DIFFUSION; SYNCHROTRON X-RAY SCATTERING; TIO;

ELECTRIC PROPERTIES; ELECTRODES; MULTILAYERS; NANOSTRUCTURED MATERIALS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SOLAR CELLS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

SILVER;

EID: 78149431488     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499282     Document Type: Article

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