Structural, morphological and electrical properties of spray deposited nano-crystalline CeO2 thin films

Journal of Alloys and Compounds

Volumn 509, Issue 2, 2011, Pages 414-420

  Patil, B B ^a   Pawar, S H ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b D Y PATIL UNIVERSITY   (India)

Author keywords

Atomic force microscopy (AFM); Chemical synthesis; Crystal structure; Fuel cells; Oxide materials

Indexed keywords

AFM; ANNEALING TEMPERATURES; CERIUM OXIDES; CHEMICAL SYNTHESIS; COST EFFECTIVE; CRYSTALLINE THIN FILMS; DEPOSITED FILMS; DEPOSITED MATERIALS; ELECTRICAL PROPERTY; FLUORITE STRUCTURE; GRAIN SIZE; IMPEDANCE SPECTROSCOPY; INDUSTRIAL CATALYST; INTERMEDIATE TEMPERATURE SOLID OXIDE FUEL CELL; NANOCRYSTALLINES; OXIDE MATERIALS; OXYGEN-ION CONDUCTIVITY; POTENTIAL APPLICATIONS; PROBE RESISTIVITY; ROOM-TEMPERATURE RESISTIVITY; SINGLE PHASE; SPRAY-DEPOSITED; SPRAY-PYROLYSIS TECHNIQUES;

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CERIUM; CERIUM COMPOUNDS; CRYSTALLINE MATERIALS; CRYSTALLITE SIZE; DIFFERENTIAL THERMAL ANALYSIS; DIFFRACTION; ELECTRIC PROPERTIES; GAS FUEL PURIFICATION; OXYGEN; SCANNING ELECTRON MICROSCOPY; SOLID OXIDE FUEL CELLS (SOFC); SPRAY PYROLYSIS; SYNTHESIS (CHEMICAL); THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

CRYSTAL ATOMIC STRUCTURE;

EID: 78149284463     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.09.045     Document Type: Article

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