Resonant Rutherford Backscattering Studies of Cerium Oxide Thin Films Deposited by RF Sputtering

IEEE Transactions on Applied Superconductivity

Volumn 7, Issue 2 PART 2, 1997, Pages 1403-1406

  Chin, C C ^a,b,c,d   Lin, R J ^a,b,c,d   Yu, Y C ^a,b,c,d   Wang, C W ^a,b,c,d   Lin, E K ^a,b,c,d   Tsai, W C ^a,b,c,d   Tseng, T Y ^a,b,c,d  

^a ACADEMIA SINICA   (Taiwan)

^b NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^c INSTITUTE OF PHYSICS   (Taiwan)

^d NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL IMPURITIES; MAGNESIA; OXIDE SUPERCONDUCTORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SAPPHIRE; SPUTTER DEPOSITION; STOICHIOMETRY; SUBSTRATES; X RAY SPECTROSCOPY;

CERIUM OXIDE THIN FILMS; X RAY PHOTOEMISSION SPECTROSCOPY;

SUPERCONDUCTING FILMS;

EID: 0031165909     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.620833     Document Type: Article

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