Changes in the structural and optical properties of CeO2 nanocrystalline films: Effect of film thickness

Journal of Alloys and Compounds

Volumn 485, Issue 1-2, 2009, Pages

  Jiang, Yinzhu ^a,b   Bahlawane, Naoufal ^a  

^a BIELEFELD UNIVERSITY   (Germany)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Band gap energy; Chemical vapor deposition; Optical properties

Indexed keywords

ATOMIC FORCE MICROGRAPHS; BAND GAP ENERGY; CERIUM DIOXIDES; CUBIC STRUCTURE; GLASS SUBSTRATES; HIGH TRANSPARENCY; NANOCRYSTALLINE FILMS; NANOCRYSTALLINES; OPTICAL MEASUREMENT; PREFERRED ORIENTATIONS; STRUCTURAL AND OPTICAL PROPERTIES; SUBMICROMETERS; SYSTEMATIC CHANGES;

CERIUM; DEPOSITION; ENERGY GAP; FILM THICKNESS; MICROELECTRONICS; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; PHOTOCATALYSIS; SUBSTRATES; THICK FILMS; X RAY DIFFRACTION;

CHEMICAL VAPOR DEPOSITION;

EID: 72049093752     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.06.118     Document Type: Letter

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